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Microstructural Studies of Sputtered Co90Fe10/Ag GMR Multilayers

Published online by Cambridge University Press:  15 February 2011

J.D. Jarratt ,
T.J. Klemmer  and
J.A. Barnard
J.D. Jarratt
Affiliation:
Department of Metallurgical and Materials Engineering, The University of Alabama, Tuscaloosa, Alabama 35487–0202.
T.J. Klemmer
Affiliation:
The Center for Materials for Information Technology andThe University of Alabama, Tuscaloosa, Alabama 35487–0202.
J.A. Barnard
Affiliation:
Department of Metallurgical and Materials Engineering, The University of Alabama, Tuscaloosa, Alabama 35487–0202.
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Abstract

The microstructure of Co90Feio/Ag giant magnetoresistive multilayer films has been investigated using x-ray diffraction (XRD) and cross-sectional transmission electron microscopy. Columnar grains with a (111) fiber growth texture is observed. A comparison is made between the observed layering structure and earlier multilayer schematics based on the literature and magnetic and magnetoresistive measurements as a function of layer thickness. A direct correlation is made between superlattice satellite peak signals from selected area electron diffraction patterns and XRD scans.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 475: Symposium M – Magnetic Ultrathin Films, Multilayers, and Surfaces – 1997 , 1997 , 351
Copyright
Copyright © Materials Research Society 1997

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References

REFERENCES

[1] Jarratt, J.D. and Barnard, J.A., Mater. Res. Soc. Symp. Proc. 403, 719 (1996).Google Scholar
[2] Hylton, T.L., Coffey, K. R., Parker, M.A., and Howard, J.K., Science 261, 1021 (1993).Google Scholar
[3] Xiao, J. C, Jiang, J.S., and Chien, C.L., Phys. Rev. Lett. 68, 3749 (1992).Google Scholar
[4] Berkowitz, A. E., et al., Phys. Rev. Lett. 68, 3745 (1992).Google Scholar
[5] Mezey, L.Z. and Giber, J., Jpn. J. Appl. Phys. 21, 1569 (1982).Google Scholar
[6] Volmer, M. and Weber, A., Z. Phys. Chem. 119, 277 (1926).Google Scholar
[7] Jarratt, J.D. and Barnard, J.A., IEEE Trans. Mag. 32, 4698 (1996).Google Scholar
[8] van Alphen, E.A.M. and de Jonge, W.J.M., Phys. Rev. B 51, 8182 (1995).Google Scholar
[9] Loloee, R., Schroeder, P.A., Pratt, W.P. Jr, Bass, J., and Fert, A., Physica B 204, 274 (1995).Google Scholar
[10] Neél, L., Compt. Rend. Acad. Sci., 255, 1545 and 1676 (1962).Google Scholar