Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-13T02:24:46.915Z Has data issue: false hasContentIssue false
  • English
  • Français

Microwave Photoconductivity Measurements to Characterize Semiconductors

Published online by Cambridge University Press:  28 February 2011

M. Kunst
M. Kunst*
Affiliation:
Hahn-Meitner Institut, Solare Energetik, D - 1000 Berlin 39, West Germany
Get access

Abstract

After a general survey of characterization techniques the use of transient photoconductivity measurements in the microwave frequency range for the characterization of semiconductors and semiconductor devices for (opto)electronic applications is treated. Experimental details and applications of these measurements are given.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 189: Symposium L – Microwave Processing of Materials II , 1990 , 75
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Sanders, A., Wetzel, H. and Kunst, M., accompanying paper in this volumeGoogle Scholar
2. Kunst, M. and Beck, G., J. Appl. Phys. 63, 1093 (1988)Google Scholar