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Nanoindentation probing of high-aspect ratio pillar structures on optical multilayer dielectric diffraction gratings

Published online by Cambridge University Press:  02 August 2012

K. Mehrotra ,
H.P. Howard ,
S.D. Jacobs  and
J.C. Lambropoulos
K. Mehrotra*
Affiliation:
Department of Mechanical Engineering Laboratory for Laser Energetics, University of Rochester, Rochester, NY 14627
H.P. Howard
Affiliation:
Materials Science Program and Laboratory for Laser Energetics, University of Rochester, Rochester, NY 14627
S.D. Jacobs
Affiliation:
Materials Science Program and Laboratory for Laser Energetics, University of Rochester, Rochester, NY 14627
J.C. Lambropoulos
Affiliation:
Department of Mechanical Engineering Materials Science Program and Laboratory for Laser Energetics, University of Rochester, Rochester, NY 14627
*
aElectronic mail: mehrotra@me.rochester.edu
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Abstract

We measure the mechanical response of optical multilayer dielectric (MLD) diffraction gratings, geometries which are constrained in only one transverse direction but free in the other, using nanoindentation. The results are explained using a stress-strain model, which reveals a uniaxial yield stress of 4.1- 4.6 GPa and predicts a similar dependence of yield stress on loads for both fully-elastic and fully-plastic solutions. Following R. Hill’s model of an expanding cavity under internal pressure, we show that the indentation response of the high-aspect ratio “pillar” geometry can be expressed in terms of uniaxial yield stress rather than material hardness.

Keywords

nano-indentationhardnessnanostructure
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1474: Symposium CCC – Local Probing Techniques and In-Situ Measurements in Materials Science , 2012 , mrss12-1474-ccc08-13
Copyright
Copyright © Materials Research Society 2012

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References

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