Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2024-12-29T04:13:47.277Z Has data issue: false hasContentIssue false

Nanoscale Structuration of Semiconductor Surface Induced by Cavitation Impact

Published online by Cambridge University Press:  13 March 2013

Tetyana G. Kryshtab
Affiliation:
Instituto Politécnico Nacional – ESFM, Department of Physics, Av. IPN, Ed. 9, U.P.A.L.M., 07738 Mexico D.F., Mexico
Rada K. Savkina
Affiliation:
V. Lashkaryov Institute of Semiconductor Physics at NAS of Ukraine, pr. Nauki 41, 03028 Kiev, Ukraine
Alexey B. Smirnov
Affiliation:
V. Lashkaryov Institute of Semiconductor Physics at NAS of Ukraine, pr. Nauki 41, 03028 Kiev, Ukraine
Get access

Abstract

Papers in the Appendix were published in electronic format as Volume 1534

Type
Articles
Copyright
Copyright © Materials Research Society 2013 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Suslickand, K. S. Flannigan, D. J., Annu. Rev. Phys. Chem. 59, 659 (2008).CrossRefGoogle Scholar
Flannigan, D. J. and Suslick, K.S., Phys. Rev. Lett. 95,044301 (2005).CrossRefGoogle Scholar
Mastai, Y. and Gedanken, A., ”Sonochemistry and other novel methods developed for synthesis of nanoparticles”, The Chemistry of Nanomaterials: Synthesis, Properties and Applications,edited by Rao, C. N. R., Müller, A., and Cheetham, A. K. (WILEY-VCH, 2004) pp. 113207.Google Scholar
Mason, T. J., Lorimer, J. P. and Walton, D. J., Ultrasonics 28, 333 (1990).CrossRefGoogle Scholar
Ashokkumar, M. and Mason, T.,SonochemistryinKirk-Othmer Encyclopedia of Chemical Technology (John Wiley and Sons, 2007).Google Scholar
Gedanken, A., Ultrasonics Sonochemistry 11, 47 (2004).CrossRefGoogle Scholar
Perkas, N., Wang, Y., Koltypin, Y., Gedanken, A., and Chandrasekaran, S., Chem. Comm. 11, 988 (2001).CrossRefGoogle Scholar
Wrigley, D. M. and Llorca, N. G., Journal of Food Protection 55, 678 (1992).CrossRefGoogle Scholar
Pishchalnikov, Y. A., Sapozhnikov, O. A., Bailey, M. R., Williams, J. C. Jr, Cleveland, R. O., Colonius, T., Crum, L. A., Evan, A. P., and McAteer, J. A., J.Endourol. 17, 435 (2003).CrossRefGoogle Scholar
Arata, Y. and Zhang, Y.-C., Appl. Phys. Letters 80, 2416 (2002).CrossRefGoogle Scholar
Nomura, S. and Toyota, H., Appl. Phys. Letters 83, 4503 (2003).CrossRefGoogle Scholar
Savkina, R. K., Smirnov, A. B., J. Phys. D: Appl. Phys. 43, 425301 (2010).CrossRefGoogle Scholar
Savkina, R. K., Functional material, 19, 38(2012).Google Scholar