Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-13T02:53:07.835Z Has data issue: false hasContentIssue false
  • English
  • Français

Optical Characterization of C60 Organic Semiconductor and Bilayers

Published online by Cambridge University Press:  10 February 2011

J. P. Rainho ,
L. Santos  and
A. A. Kharlamov
J. P. Rainho
Affiliation:
Physics Department, University of Aveiro 3810 Aveiro, Portugal
L. Santos
Affiliation:
Physics Department, University of Aveiro 3810 Aveiro, Portugal
A. A. Kharlamov
Affiliation:
Physics Department, University of Aveiro 3810 Aveiro, Portugal
Get access

Abstract

Preparation and characterization either by optical absorption, photoluminescence and micro-Raman spectroscopy of individual components as well as bilayers consisting of organic dye semiconductor Zinc Phthalocyanine (ZnPc) and fullerene, C60, thin films are reported. The layers and structures were deposited in vacuum and some fullerene films were also prepared by casting the C60 solution in benzene. The optical absorption and photoluminescence dependencies on film thickness in bilayers C60/ZnPc were observed and may be discussed in a context of interface induced simmetry reduction of C60 molecules.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 488: Symposium J – Electrical, Optical & Magnetic Properties of Organic IV , 1997 , 933
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Kratschmer, W., Lamb, D.L., Fostiropoulous, K., Huffman, D.R., Nature 347 p. 354 (1990)Google Scholar
2. Minami, N., Chem. Lett. Chem. Soc. of Japan 10 p. 1791 (1991)Google Scholar
3. Kiser, M., Reichenbach, J., Byrne, H.J., Andres, J., Maser, W., Roth, S., Zahab, A., Bernier, P., Solid State Commun. 81 p. 261 (1992)Google Scholar
4. Kazaoui, S., Ross, R. and Minami, N., Solid State Comm. 90, n° 10, p. 623 (1994)Google Scholar
5. Sinha, A., Menendez, J., Hanson, R.C., Adams, G.B., Page, J.B., Sankey, O.F., Lamb, L.D., Huffman, D.R., Chem. Phys. Letters 186 p. 2 (1991)Google Scholar
6. Reber, C., Yee, L., McKiernan, J., Zink, J.I., Williams, R.S., Tong, W.M., Ohlberg, D.A., Whetten, R.L., Diederich, F., J. Phys. Chem. 95 p. 2127 (1991)Google Scholar
7. Sauvajol, J.L., Hricha, Z., Coustel, N., Zahab, A., Aznar, R., J. Phys.: Condens. Matter 5 p. 2045 (1993)Google Scholar
8. Uchida, M., Ohmori, Y., Yoshino, K., Jpn. J. Appl. Phys., 30 p. 2104 (1991)Google Scholar
9. Uchida, M., Ohmori, Y., Yoshino, K., Techn. Rep. of the Osaka University 42 p. 145 (1992).Google Scholar
10. Saito, S., Oshiyama, A., Phys. Rev. Letters 66 p. 2637 (1991)Google Scholar
11. Sariciftici, N.S., Smilowitz, L., Heeger, A.J., Wudl, F., Science 258 p. 1474 (1992)Google Scholar
12. Smilowitz, L., Sariciftici, N.S., Wu, R., Gettinger, C., Heeger, A.J., Wudl, F., Phys. Rev. B 47 p. 13835 (1993)Google Scholar
13. Siebentritt, S., Günster, S. and Meissner, D., Synthetic Metals, 41–43 p. 1173 (1991).Google Scholar
14. Larina, L.L., Melnik, N.N., Poponin, V.P., Shevaleevskii, O.I. and Kalachev, A.A., Materials Science Forum, 73–174 p. 231 (1995).Google Scholar