Hostname: page-component-5f745c7db-sbzbt Total loading time: 0 Render date: 2025-01-06T06:48:12.737Z Has data issue: true hasContentIssue false
  • English
  • Français

Optical Feedback on Erbium Doped Fibre Laser for Efficient Heterodyne SNOM Imaging Near 1.5μm

Published online by Cambridge University Press:  31 January 2011

Pierre Bahin ,
hervé Gilles ,
Sylvain Girard ,
Fabrice Gourbilleau ,
Mathieu Laroche  and
Richard Rizk
Pierre Bahin
Affiliation:
bahin@ecole.ensicaen.fr, CIMAP, Caen, France
hervé Gilles
Affiliation:
herve.gilles@ensicaen.fr, CIMAP, Caen, France
Sylvain Girard
Affiliation:
sylvain.girard@ensicaen.fr, CIMAP, Caen, France
Fabrice Gourbilleau
Affiliation:
fabrice.gourbilleau@ensicaen.fr, CIMAP, Caen, France
Mathieu Laroche
Affiliation:
mathieu.laroche@ensicaen.fr, CIMAP, Caen, France
Richard Rizk
Affiliation:
richard.rizk@ensicaen.fr, CIMAP, Caen, France
Get access

Abstract

Heterodyne optical feedback on a class B laser is investigated for Scanning Near field Optical Microscopy (SNOM). All-fiberized set-up combining an Er-doped Distributed Feedback (DFB) fiber laser, a pair of pigtailed acousto-optics modulators (AOM) and a shear-force based scanning probe technique has been developed for the simultaneous observation of topography and evanescent light field on integrated optical devices. First demonstration of imaging using this technique is illustrated by characterizing the propagating modes into a rib waveguide at 1.54μm. Comparison between a theoretical model based on beam propagation mode (BPM) simulations and experimental measurements validates the results.

Keywords

scanning probe microscopy (SPM)optical propertiesnanoscale
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1182: Symposium EE – Materials for Nanophotonics–Plasmonics, Metamaterials and Light Localization , 2009 , 1182-EE13-14
Copyright
Copyright © Materials Research Society 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Balistreri, M.L.M., Korterik, J.P., Kuipers, L., Hulst, N.F. van, Physical Review Letters, 85, 294 (2000).Google Scholar
2 Nesci, A., R. Dändliker, Herzig, H.P., Optics Letters, 26, 208 (2001).Google Scholar
3 Nesci, A., Fainman, Y., Proceedings of SPIE. 5181, 62 (2003).Google Scholar
4 Tortora, P., Abashin, M., Märki, I., Nakagawa, W., Vaccaro, L.. Salt, M., Herzig, H.P., Levy, U., Fainman, Y., Optics Letters, 30, 2885 (2005).Google Scholar
5 Stefanon, I., Blaize, S., Bruyant, A., Aubert, S., Lerondel, G., Bachelot, R. and Royer, P., Optics Express, 13, 5553 (2005)Google Scholar
6 Lacot, E., Day, R., Stoeckel, F., Optics Letters, 24, 744 (1999).Google Scholar
7 Lacot, E., Day, R., Stoeckel, F., Physical Review A, 64, 438151 (2001).Google Scholar
8 Gilles, H., Girard, S., Laroche, M. and Belarouci, A., Optics Letters, 33 1 (2008).Google Scholar
9 Blaize, S., Bérenguier, B., Stéfanon, I., Bruyant, A., Lérondel, G., Royer, P., Hugon, O., Jacquin, O. and Lacot, E., Optics Express, 16, 11718 (2008).Google Scholar
10 Navarro-Urrios, D., Daldosso, N., Garcia, C., Pellegrino, P., Garrido, B., Gourbilleau, F., Rizk, R. and Pavesi, L., Japanese Journal of Applied Physics, 46, 6626 (2007).Google Scholar
11 Gourbilleau, F., Levalois, M., Dufour, C., Rizk, R., Journal of Applied Physics, 95, 3717 (2004).Google Scholar
12 Karrai, K., Grober, R.D., Appl. Phys. Lett. 66, 1842 (1995).Google Scholar