Hostname: page-component-78c5997874-ndw9j Total loading time: 0 Render date: 2024-11-11T04:19:01.470Z Has data issue: false hasContentIssue false
  • English
  • Français

Optical Monitoring of Nanocrystalline Diamond with Reduced Non-diamond Contamination

Published online by Cambridge University Press:  31 January 2011

Zdenek Remes ,
Alexander Kromka ,
Tibor Izak ,
Adam Purkrt  and
Milan Vanecek
Zdenek Remes
Affiliation:
remes@fzu.cz, Institute of Physics of the ASCR,v.v.i., Praha 6, Czech Republic
Alexander Kromka
Affiliation:
kromka@fzu.cz, Institute of Physics of the ASCR,v.v.i., Praha 6, Czech Republic
Tibor Izak
Affiliation:
tibor.izak@gmail.com, Institute of Physics of the ASCR,v.v.i., Praha 6, Czech Republic
Adam Purkrt
Affiliation:
purkrt@fzu.cz
Milan Vanecek
Affiliation:
vanecek@fzu.cz, Institute of Physics of the ASCR,v.v.i., Praha 6, Czech Republic
Get access

Abstract

Previously, the nanocrystalline grain boundaries were often contaminated by the “non-diamond phase” with the photo-ionization threshold at 0.8 eV. Here, we present the optical spectra of the NCD films grown on transparent substrates by the microwave plasma enhanced chemical vapor deposition (CVD) at a relatively low temperature below 600°C. The transmittance and reflectance spectra are useful to evaluate the film thickness, the surface roughness and the index of refraction. The direct measurement of the optical absorptance by the laser calorimetry and photothermal deflection spectroscopy (PDS) provides high sensitive methods to measure the weak optical absorption of thin films with rough surface. The optical measurements indicate the high optical transparency of our standard, nominally undoped 0.2-0.3 μm thick NCD film with low non-diamond content. However, the optical scattering is rather high in UV and needs to be reduced.

Keywords

diamondoptical propertiespolycrystal
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1203: Symposium J – Diamond Electronics and Bioelectronics-Fundamentals to Applications III , 2009 , 1203-J17-13
Copyright
Copyright © Materials Research Society 2010

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Gruen, D. M., Annual Review of Materials Science 29, 211 (1999).Google Scholar
[2] Williams, O. A., Nesladek, M., Daenen, M., Michaelson, S., Hoffman, A., Osawa, E., Haenen, K. and Jackman, R. B., Diamond and Related Materials 17, 1080 (2008).Google Scholar
[3] Wenmackers, S., Pop, S. D., Roodenko, K., Vermeeren, V., Williams, O. A., Daenen, M., Douheret, O., D'Haen, J., Hardy, A., Bael, M. K. Van, Hinrichs, K., Cobet, C., Vandeven, M., Ameloot, M., Haenen, K., Michiels, L., Esser, N. and Wagner, P., Langmuir 24, 7269 (2008).Google Scholar
[4] Cermak, J., Rezek, B., Kromka, A., Ledinsky, M. and Kocka, J., Diamond and Related Materials 18, 1098 (2009)Google Scholar
[5] Michalikova, L., Rezek, B., Kromka, A. and Kalbacova, M., Vacuum 84, 61 (2009).Google Scholar
[6] Kromka, A., Rezek, B., Remes, Z., Michalka, M., Ledinsky, M., Zemek, J., Potmesil, J. and Vanecek, M., Chemical Vapor Deposition 14, 181 (2008).Google Scholar
[7] Remes, Z., Kromka, A., Vanecek, M., Ghodbane, S. and Steinmuller-Nethl, D., Diamond and Related Materials 18, 726 (2009).Google Scholar
[8] Achatz, P., Garrido, J. A., Stutzmann, M., Williams, O. A., Gruen, D. M., Kromka, A. and Steinmuller, D., Applied Physics Letters 88, 101908 (2006).Google Scholar
[9] Remes, Z., Kromka, A. and Vanecek, M., Physica Status Solidi (A) Applications and Materials 206, 2004 (2009).Google Scholar
[10] Potocky, S., Kromka, A., Potmesil, J., Remes, Z., Vorlicek, V., Vanecek, M. and Michalka, M., Diamond and Related Materials 16, 744 (2007).Google Scholar
[11] Williams, O. A., Douheret, O., Daenen, M., Haenen, K., Osawa, E. and Takahashi, M., Chemical Physics Letters 445, 255 (2007).Google Scholar
[12] Kromka, A., Potocky, S., Cermak, J., Rezek, B., Potmesil, J., Zemek, J. and Vanecek, M., Diamond and Related Materials 17, 1252 (2008).Google Scholar
[13] Kozak, H., Kromka, A., Ukraintsev, E., Houdkova, J., Ledinsky, M., Vanecek, M. and Rezek, B., Diamond and Related Materials 18, 722 (2009).Google Scholar
[14] Yin, Z., Tan, H. S. and Smith, F. W., Diamond and Related Materials 5, 1490 (1996).Google Scholar
[15] Willamowski, U., Ristau, D. and Welsch, E., Applied Optics 37, 8362 (1998).Google Scholar
[16] Vandevelde, T., Nesladek, M., Meykens, K., Quaeyhaegens, C., Stals, L. M., Gouzman, I. and Hoffman, A., Diamond and Related Materials 7, 152 (1998).Google Scholar
[17] Iakoubovskii, K. and Adriaenssens, G. J., Journal of Physics Condensed Matter 12, L77 (2000).Google Scholar
[18] Nesladek, M., Meykens, K., Stals, L. M., Vanecek, M. and Rosa, J., Physical Review B -Condensed Matter and Materials Physics 54, 5552 (1996).Google Scholar