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Optical Properties of Multi-layer Chalcogenide Thin Film for Optical Recording Media

Published online by Cambridge University Press:  01 February 2011

Myung-Jin Kang ,
Chan-Gyung Park  and
Se-Young Choi
Myung-Jin Kang
Affiliation:
Department of Ceramic Engineering, Yonsei University 134, Shinchon-dong, Sudaemun-ku, Seoul, 120–749, Korea
Chan-Gyung Park
Affiliation:
Department of Ceramic Engineering, Yonsei University 134, Shinchon-dong, Sudaemun-ku, Seoul, 120–749, Korea
Se-Young Choi
Affiliation:
Department of Ceramic Engineering, Yonsei University 134, Shinchon-dong, Sudaemun-ku, Seoul, 120–749, Korea
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Abstract

We present the results of optical properties of multi layer thin films as in the media of phase change optical disk data storage. Reflectance and optical contrast of multi layer thin films increased rapidly between 100 °C and 150 °C. Moreover, optical contrasts at different wavelength were also studied. The refractive index and the optical band gap decreased, while the extinction coefficient increases as the crystallization occurs. The Egopt of crystalline thin film was ∼0.6 eV lower than that of amorphous thin film. Egopt decreased as the number of stacked layer increased.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 803: Symposia GG/HH – Advanced Characterization Techniques for Data Storage Materials – Phase Change and Nonmagnetic Materials for Data Storage , 2003 , HH4.7
Copyright
Copyright © Materials Research Society 2004

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References

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