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Opto-electrical characterization and X-ray Mapping of large-volume cadmium zinc telluride radiation detectors

Published online by Cambridge University Press:  31 January 2011

Ge Yang ,
Aleksey E Bolotnik ,
Giuseppe Camarda ,
Yonggang Cui ,
Anwar Hossain ,
Walter Yao ,
Ki Hyun Kim  and
Ralph James
Ge Yang
Affiliation:
gyang@bnl.gov, Brookhaven National Laboratory, Building 197D, Brookhaven National Laboratory, Upton, New York, 11973, United States, 6313444341
Aleksey E Bolotnik
Affiliation:
bolotnik@bnl.gov, Brookhaven National Laboratory, Upton, New York, United States
Giuseppe Camarda
Affiliation:
Giuseppec@bnl.gov, Brookhaven National Laboratory, Upton, New York, United States
Yonggang Cui
Affiliation:
ycui@bnl.gov, Brookhaven National Laboratory, Upton, New York, United States
Anwar Hossain
Affiliation:
hossain@bnl.gov, Brookhaven National Laboratory, Upton, New York, United States
Walter Yao
Affiliation:
hwyao@bnl.gov, Brookhaven National Laboratory, Upton, New York, United States
Ki Hyun Kim
Affiliation:
khkim@bnl.gov, Brookhaven National Laboratory, Upton, New York, United States
Ralph James
Affiliation:
rjames@bnl.gov, Brookhaven National Laboratory, Upton, New York, United States
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Abstract

Large-volume cadmium zinc telluride (CZT) radiation detectors would greatly improve radiation detection capabilities and, therefore, attract extensive scientific and commercial interests. CZT crystals with volumes as large as hundreds of centimeters can be achieved today due to improvements in the crystal growth technology. However, the poor performance of large-volume CZT detectors is still a challenging problem affecting the commercialization of CZT detectors and imaging arrays. We have employed Pockels effect measurements and synchrotron X-ray mapping techniques to investigate the performance-limiting factors for large-volume CZT detectors. Experimental results with the above characterization methods reveal the non-uniform distribution of internal electric field of large-volume CZT detectors, which help us to better understand the responsible mechanism for the insufficient carrier collection in large-volume CZT detectors.

Keywords

deviceselectrical propertiesII-VI
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1164: Symposium L – Nuclear Radiation Detection Materials–2009 , 2009 , 1164-L10-07
Copyright
Copyright © Materials Research Society 2009

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