Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-11T03:49:40.937Z Has data issue: false hasContentIssue false
  • English
  • Français

Pattern Shape-Controlled Self-Assembly of Bi0.90Si0.10 Nanocrystallites

Published online by Cambridge University Press:  21 March 2011

Jiye Fang ,
Kevin L. Stokes ,
Jibao He ,
Weilie L. Zhou  and
Charles J. O'Connor
Jiye Fang
Affiliation:
Advanced Materials Research Institute, University of New Orleans, New Orleans, LA 70148, E-mail: jfang1@uno.edu
Kevin L. Stokes
Affiliation:
Advanced Materials Research Institute, University of New Orleans, New Orleans, LA 70148
Jibao He
Affiliation:
Advanced Materials Research Institute, University of New Orleans, New Orleans, LA 70148
Weilie L. Zhou
Affiliation:
Advanced Materials Research Institute, University of New Orleans, New Orleans, LA 70148
Charles J. O'Connor
Affiliation:
Advanced Materials Research Institute, University of New Orleans, New Orleans, LA 70148
Get access

Abstract

Nanometer-sized Bi0.90Sb0.10 has been, for the first time, prepared using a hightemperature organic solution reducing method. With the presence of proper capping and stabilizing agents, we were able to produce Bi0.90Sb0.10 nanoparticles as small as ∼12 nm. Nearly monodisperse distributions were obtained through a size-selective post treatment. Transmission electron microscope characterization reveals that the as-prepared particles have a highly crystalline single rhombohedral phase. Self-assembled patterns of Bi0.90Sb0.10 were successfully achieved upon evaporation of the solvent from the nanoparticle colloids. As a step toward possible applications of these particles in thermoelectric device structures, we have also demonstrated that we are able to control the pattern of Bi0.90Sb0.10 self-assembly from 2D to 1D by employing different solvent systems with varying ratios of polar and non-polar components.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 691: Symposium G – Thermoelectric Materials 2001--Research and Applications , 2001 , G10.3
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Cho, S., DiVenere, A., Wong, G.K., Ketterson, J.B. and Meyer, J.R., Phys. Rev. B 59, 10691 (1999); M. Lu, R.J. Zieve, A. van Hulst, H.M. Jaeger, T.F. Rosenbaum and S. Radelaar, Phys. Rev. B 53, 1609 (1996).Google Scholar
2. Lenoir, B., Cassart, M., Michenaud, J.-P., Scherrer, H. and Scherrer, S., J. Phys. Chem. Solids 57, 89 (1996).Google Scholar
3. Yim, W.M. and Amith, A., Solid-State Electron. 15, 1141 (1972).Google Scholar
4. Hicks, L.D., Harman, T.C. and Dresselhaus, M.S., App. Phys. Lett. 63, 3230 (1993).Google Scholar
5. Hicks, L.D. and Dresselhaus, M.S., Phys. Rev. B 47, 16631 (1993).Google Scholar
6. Hicks, L.D., Harman, T.C., Sun, X. and Dresselhaus, M.S., Phys. Rev. B. 53, R10493 (1996).Google Scholar
7. Lin, Y.-M., Sun, X. and Dresselhaus, M.S., Phys. Rev. B 62, 4610 (2000).Google Scholar
8. Heremans, J., Thrush, C.M., Lin, Y.-M., Cronin, S., Zhang, Z., Dresselhaus, M.S. and Mansfield, J.F., Phys. Rev. B 61, 2921 (2000).Google Scholar
9. Fang, J., Stokes, K.L., Zhou, W.L., Wang, W. and Lin, J., Chem. Comm., 1872 (2001).Google Scholar
10. Murray, C.B., Kagan, C.R. and Bawendi, M.G., Annu. Rev. Mater. Sci. 30, 545 (2000).Google Scholar
11. Sun, S. and Murray, C.B., J. App. Phys., 85, 4325 (1999).Google Scholar
12. Sun, S. and Murray, C.B., Doyle, H., Mat. Res. Soc. Symp. Proc., 577, 395 (1999).Google Scholar
13. Murray, C.B., Sun, S., Gaschler, W., Doyle, H., Betley, T.A. and Kagan, C.R., IBM J. Res. Dev. 45, 47 (2001).Google Scholar
14. Cullity, B.D., in Elements of X-ray Diffraction, 2nd ed. (Addison-Wesley, Reading, MA, 1978) 284.Google Scholar
15. Horn, R. and Israelachvilli, J., J. Phys. Chem. 75, 1400 (1981).Google Scholar
16. Christenson, H. K., J. Dispersion Sci. Technol. 9, 171 (1988).Google Scholar