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Phosphors as Sensors for Radiation-Induced Displacement Damage

Published online by Cambridge University Press:  13 July 2012

S. L. Gollub
Affiliation:
Interdisciplinary Graduate Program in Materials Science, Vanderbilt University
R. R. Harl
Affiliation:
Department of Chemical and Biomolecular Engineering, Vanderbilt University
S. L. Weeden-Wright
Affiliation:
Department of Electrical Engineering, Vanderbilt University
B. R. Rogers
Affiliation:
Department of Chemical and Biomolecular Engineering, Vanderbilt University
D. G. Walker*
Affiliation:
Department of Mechanical Engineering, Vanderbilt University
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Abstract

The radiation-induced displacement damage in yttrium borate (YBO3) is studied under X-ray, proton, and alpha irradiation. The photoluminescence (PL) was tested before and after irradiation to determine whether damage occurred and whether it could be queried by examining the PL spectrum. Two different dopants (cerium and europium) were used to activate the phosphor because each provides not only a different spectral signature but also a different mechanism for altering the spectrum between the pre- and post-PL measurements. X-rays, being primarily ionizing radiation, did not show any significant change between the pre and post measurements. We expected protons and alphas to damage the crystal structure, evidence of which could be seen in the change in the spectra before and after irradiation. However, we found no change under alpha exposure (3.6 × 1010 particles/cm2) and a significant change after proton exposure (5 × 1015 particles/cm2). While the material appears to be sensitive to protons, we cannot rule out its sensitivity to alphas because the alpha fluence may be too low to show an effect. This result provides strong indication that our materials are being damaged by particle radiation and that the radiation effects can be quantified.

Type
Articles
Copyright
Copyright © Materials Research Society 2012

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