Hostname: page-component-cd9895bd7-7cvxr Total loading time: 0 Render date: 2024-12-29T11:55:22.749Z Has data issue: false hasContentIssue false
  • English
  • Français

Pre-eminence of the Indirect Channel in the Resonant Inverse Photoelectron Spectroscopy of Cerium Oxide

Published online by Cambridge University Press:  13 April 2012

J. G. Tobin ,
S.-W. Yu ,
B.W. Chung  and
G.D. Waddill
J. G. Tobin*
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA, USA
S.-W. Yu
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA, USA
B.W. Chung
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA, USA
G.D. Waddill
Affiliation:
Missouri Univ. of Science and Technology, Dept of Physics, Rolla, MO 65401
*
*Corresponding Author, Tobin1@LLNL.Gov
Get access

Abstract

A strong resonance in the inverse photoelectron spectroscopy (IPES) of cerium oxide was reported recently. Here, it is shown that dominance of the indirect channel of the resonant inverse photoelectron spectroscopy (RIPES) is so complete that the photon energy dependence can be explained in terms of emission associated with a single photon energy.

Keywords

x-ray photoelectron spectroscopy (XPS)Ceoxide
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1444: Symposium S/Y – Actinides and Nuclear Energy Materials , 2012 , mrss12-1444-y06-19
Copyright
Copyright © Materials Research Society 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Tobin, J.G., Yu, S.W., Chung, B.W., Waddill, G.D., Damian, E., Duda, L. and Nordgren, J., Phys. Rev B 83, 085104 (2011).Google Scholar
2. Tobin, J.G., Yu, S.-W., Chung, B.W., Waddill, G.D. and Denlinger, J.D., J. Vac. Sci. Tech. A 29, 031504 (2011).Google Scholar
3. Mishra, S.R., Cummins, T.R., Waddill, G. D., Gammon, W.J., van der Laan, G., Goodman, K.W., and Tobin, J.G., Phys. Rev. Lett. 81, 1306 (1998).Google Scholar
4. Veal, B.W. and Lam, D. J., Phys. Rev. B 10, 4902 (1974); Phys. Lett.A 49, 466 (1974).Google Scholar
5. Yu, S.-W., Tobin, J. G., and Chung, B. W., Rev. Sci. Instruments 82, 093903 (2011).Google Scholar
6. Yu, S.-W., Tobin, J. G., Crowhurst, J. C., Sharma, S., Dewhurst, J. K., Olalde-Velasco, P., Yang, W. L., and Siekhaus, W. J., Phys. Rev. B 83, 165102 (2011).Google Scholar
7. Tobin, J.G. and Schumann, F.O., Surface Science 478, 211 (2001).Google Scholar
8. Knapp, B. and Tobin, J., Phys. Rev. B 37, 8656 (1988).Google Scholar
9. Grioni, M. et al. ., J. Electron Spectrosc. Relat. Phenom. 101–103, 713 (1999).Google Scholar
10. Tobin, J.G. and Yu, S.-W., Phys. Rev. Lett, 107, 167406 (2011).Google Scholar