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Quantitative X-Ray Structure Determination of Superlattices and Interfaces

Published online by Cambridge University Press:  15 February 2011

Ivan K. Schuller ,
Eric E. Fullerton ,
H. Vanderstraeten  and
Y. Bruynseraede
Ivan K. Schuller
Affiliation:
Physics Department 0319, University of California - San Diego, La Jolla, California 92093, USA
Eric E. Fullerton
Affiliation:
Physics Department 0319, University of California - San Diego, La Jolla, California 92093, USA
H. Vanderstraeten
Affiliation:
Laboratorium voor Vaste Stof-Fysika en Magnetisme, Katholieke Universiteit Leuven, B-3001 Leuven, Belgium.
Y. Bruynseraede
Affiliation:
Laboratorium voor Vaste Stof-Fysika en Magnetisme, Katholieke Universiteit Leuven, B-3001 Leuven, Belgium.
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Abstract

We present a general procedure for quantitative structural refinement of superlattice structures. To analyze a wide range of superlattices, we have derived a general kinematical diffraction formula that includes random, continuous and discrete fluctuations from the average structure. By implementing a non-linear fitting algorithm to fit the entire x-ray diffraction profile, refined parameters that describe the average superlattice structure, and deviations from this average are obtained. The structural refinement procedure is applied to a crystalline/crystalline Mo/Ni superlattices and crystalline/amorphous Pb/Ge superlattices. Roughness introduced artificially during growth in Mo/Ni superlattices is shown to be accurately reproduced by the refinement.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 229: Symposium Q – Structure/Property Relationships for Metal/Metal Interfaces , 1991 , 41
Copyright
Copyright © Materials Research Society 1991

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References

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