Hostname: page-component-6bf8c574d5-2jptb Total loading time: 0 Render date: 2025-02-22T15:53:10.429Z Has data issue: false hasContentIssue false
  • English
  • Français

Self-Affine Fractal Characterization of a TNT Fracture Surface

Published online by Cambridge University Press:  15 February 2011

L. V. Meisel ,
R. D. Scanlon ,
M. A. Johnson  and
Y. D. Lanzerotti
L. V. Meisel
Affiliation:
U. S. Army TACOM-ARDEC, Benet Laboratories, Watervliet, NY 12189
R. D. Scanlon
Affiliation:
U. S. Army TACOM-ARDEC, Benet Laboratories, Watervliet, NY 12189
M. A. Johnson
Affiliation:
U. S. Army TACOM-ARDEC, Benet Laboratories, Watervliet, NY 12189
Y. D. Lanzerotti
Affiliation:
U. S. Army TACOM-ARDEC, Picatinny Arsenal, NJ 07806-5000
Get access

Abstract

A trinitrotoluene (TNT) fracture surface image is characterized in terms of a self-affine fractal structure. The fracture surface was produced by high acceleration in an ultracentrifuge when the TNT strength was exceeded. An atomic force microscope (AFM) captured the topography of a 4 micron square region on the fracture surface. The present analysis supports a self-affine description of the TNT fracture surface (wavelengths of 0.016 micron to 4.0 micron) and provides a new prespective on fracture processes in TNT. An essential step in self-affine fractal characterization of surfaces is the determination of reference surfaces. A self-affine fracture surface can be described in terms of a single-valued height function. In the TNT fracture surface, single-valued height functions, which describe surface texture can only be defined with respect to curved reference surfaces. By employing curved reference surfaces, we have demonstrated that self-affine fractal scaling can be used to characterize the TNT fracture surface. This provides important information that is not evident in the analysis of individual surface scans.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 578: Symposia A/C – Multiscale Phenomena in Materials - Experiments in Modeling , 1999 , 363
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Lanzerotti, Y. D., and Sharma, J., Appl. Phys. Letters 39, p. 455–457 (1981).Google Scholar
2. Lanzerotti, Y. D., Pinto, J., and Wolfe, A., in The Ninth Symposium (International) on Detonation, OCNR 113291-7, 1989, Volume II, p. 918–924.Google Scholar
3. Lanzerotti, Y. D., Pinto, J., Wolfe, A., and Thomson, D. J., in The Tenth Symposium (International) on Detonation, ONR 33395-12, Office of Naval Research, Arlington, VA, 1993, p. 190–198.Google Scholar
4. Lanzerotti, Y. D., Miesel, L. V., Johnson, M. A., Wolfe, A., and Thomson, D. J., in Atomic Resolution Microscopy of Surfaces and Interfaces, edited by Smith, D., Materials Research Society, Pittsburgh, PA, 1997, p. 179–184.Google Scholar
5. Mandelbrot, B. B., The Fractal Geometry of Nature, Freeman, New York, 1983, p. 352.Google Scholar
6. Gouyet, J. F., Rosso, M., and Sapoval, B., in Fractals and Disordered Systems, edited by Bunde, A. and Havlin, S., Springer, Berlin, 1991.Google Scholar
7. Meisel, L. V., Scanlon, R. D., Johnson, M. A., Lanzerotti, Y. D., Proc. APS Topical Conf. Shock Compression of Condensed Matter, June 1999 (in press).Google Scholar