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A Simulation Study of Tracer Diffusion Concentration Profiles Resulting from the Transition from Dislocation Pipes to a Grain Boundary Slab

Published online by Cambridge University Press:  21 March 2011

Irina V Belova  and
Graeme E Murch
Irina V Belova
Affiliation:
Diffusion in Solids Group, Dept. Mechanical Engineering The University of Newcastle, Callaghan, NSW 2308, AUSTRALIA
Graeme E Murch
Affiliation:
Diffusion in Solids Group, Dept. Mechanical Engineering The University of Newcastle, Callaghan, NSW 2308, AUSTRALIA
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Abstract

In the present study we examine the well-known analysis in which the dislocation pipe diffusivity is determined by means of a grain boundary type analysis of the tail of a tracer concentration depth profile. We use a Monte Carlo grid method for testing the analysis. The results show that the analysis is really only satisfactory when the spacing between the dislocations is roughly twice the diffusion length (D l t)½ where D l and t are the lattice diffusivity and time respectively.

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References

REFERENCES

1. Kaur, I., Mishin, Y. and Gust, W., Fundamentals of Grain and Interphase Boundary Diffusion (Wiley, 1995).Google Scholar
2. Peterson, N.L., Int. Mater. Rev., 28, 65 (1983).Google Scholar
3. Gupta, D., Campbell, D.R. and Ho, P.S., in Thin Films: Interdiffusion and Reactions, ed. Poate, J.M., Tu, K.N.. (Wiley, 1978), pp 161–242.Google Scholar
4. Mishin, Y., Herzig, Chr., Bernadini, J. and Gust, W., Int. Mater. Res., 42, 155 (1997).Google Scholar
5. Claire, A.D. Le and Rabinovitch, A., in Diffusion in Crystalline Solids, ed. Murch, G.E. and Nowick, A.S.. (Academic, 1984), pp 257–318.Google Scholar
6. Belova, I.V. and Murch, G.E., Phil. Mag. A, in press.Google Scholar
7. Read, W.T. and Shockley, W., Phys. Rev. 78, 225 (1950).Google Scholar
8. Claire, A.D. Le in Diffusion in Solid Metals and Alloys, Landolt-Bornstein, Vol. 26, (Springer-Verlag, 1990), pp 626–629.Google Scholar
9. Murch, G.E., Diffusion and Defect Data, 32, 1(1983).Google Scholar
10. Murch, G.E. and Rothman, S.J., Diffusion and Defect Data, 42, 17 (1985).Google Scholar
11. Murch, G.E., in Diffusion in Crystalline Solids, ed. Murch, G.E. and Nowick, A.S., (Academic, 1984), pp 379–427.Google Scholar
12. Whipple, R.T., Phil. Mag., 45, 1225 (1954).Google Scholar