Published online by Cambridge University Press: 15 February 2011
We have examined the electronic susceptibility of intercalated graphite and doped (CH)x using ESR [1]. The dopant in both cases was AsF5. For metallic intercalated graphite and for heavily doped (CH)x, the low frequency Schumacher-Slichter technique was used to determine the density of states at the Fermi energy. In the case of doped (CH)x, susceptibility measurements as a function of temperature allowed separate determination of the Curie and Pauli contributions.