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Stability of Single and Tandem Junction A-Si:H Solar Cells Grown using the ECR Process

Published online by Cambridge University Press:  15 February 2011

Vikram L. Dalal ,
Tim Maxson ,
Robert Girvan  and
Sohail Haroon
Vikram L. Dalal
Affiliation:
Iowa State University, Microelectronics Research center Ames, Iowa 50011, USA
Tim Maxson
Affiliation:
Iowa State University, Microelectronics Research center Ames, Iowa 50011, USA
Robert Girvan
Affiliation:
Iowa State University, Microelectronics Research center Ames, Iowa 50011, USA
Sohail Haroon
Affiliation:
Iowa State University, Microelectronics Research center Ames, Iowa 50011, USA
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Abstract

We report on the fabrication and stability tests of single junction a-Si:H, and tandem junction a-Si:H/a-Si:H solar cells using the ECR process under high hydrogen dilution (H-ECR process). We show that devices with high fill factors can be made using the H-ECR process. We also report on the stability studies of the solar cells under 1 and 2-sun illumination conditions. The solar cells show very little degradation even after 500 hours of illumination under 2 x sunlight illumination.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 467: Symposium A – Amorphous and Microcrystalline Silicon Technology - 1997 , 1997 , 813
Copyright
Copyright © Materials Research Society 1997

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References

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