Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-10T08:51:00.265Z Has data issue: false hasContentIssue false

Stabilization of Thick Fcc Cobalt Layers by One Monolayer of Manganese in Co/Mn Superlattices

Published online by Cambridge University Press:  10 February 2011

V. Pierron-Bohnes
Affiliation:
IPCMS-GEMME, 23 rue du Loess, 67037 Strasbourg, France
A. Michel
Affiliation:
IPCMS-GEMME, 23 rue du Loess, 67037 Strasbourg, France
J.P. Jay
Affiliation:
IPCMS-GEMME, 23 rue du Loess, 67037 Strasbourg, France
P. Panissod
Affiliation:
IPCMS-GEMME, 23 rue du Loess, 67037 Strasbourg, France
Get access

Abstract

Epitaxial Co/Mn superlattices (0.6 to 4.8 nm thick Co) have been grown on (0002) hcp Ru buffer layer on mica substrates. The face centered cubic (fcc) phase of cobalt is stabilized by the very thin manganese layer. The structural properties of these layers have been studied through x ray diffraction and nuclear magnetic resonance.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Papon, A.M., Simon, J.P., Guyot, P., and Desjonqueres, M.C., Phil. Mag., 39, 301 (1979); Ericson, Acta Metall. 14, 853 (1966).Google Scholar
[2] Paterson, M.S., J. Applied Phys. 8 805 (1952); A. Guinier, in Théorie et technique de la radiocristallographie, Dunod, Paris (1964); M.T. Sebastian and P. Krishna, Phys. Stat. Sol. 101, 329 (1987).Google Scholar
[3] Henry, Y., Pierron-Bohnes, V., Vennegues, P., Ounadjela, K., J. Appl. Phys. 76, 2817 (1994).Google Scholar
[4] Ounadjela, K., Vennegues, P., Henry, Y., Michel, A., Pierron-Bohnes, V., and Arabski, J., Phys. Rev. B 49, 8561 (1994)Google Scholar
[5] Michel, A., PhD thesis, Strasbourg, France, 1995.Google Scholar
[6] Muller, D., Ounadjela, K., Vennegues, P., Pierron-Bohnes, V., Arbaoui, A., Jay, J.P., Dinia, A., and Panissod, P., J.M.M.M. 104 1873 (1992).Google Scholar
[7] Mény, C., Panissod, P. and Loloee, R., Phys. Rev. B45 12269 (1992)Google Scholar
[8] Panissod, P., Jay, J.Ph., Mény, C., Wójcik, M. and Jedryka, E., Mat. Res. Soc. Proc. 384 61 (1995) and Hyperfine Int. 97-98 75 (1996)Google Scholar
[9] Toth, L.E., Ravitz, S.F., J. Phys. Chem. Solids 24 1203 (1963)Google Scholar
[10] Gronckel, H.A.M. de, Bloemen, P.J.H., Alphen, E.A.M. van, Jonge, W.J.M. de, Phys. Rev. B49 11327 (1994)Google Scholar
[11] Mény, C., Jedryka, E., Panissod, P., J. Phys. Cond. Matter 5 1547 (1993)Google Scholar
[12] Michel, A., Pierron-Bohnes, V., Lefebvre, S., Bessière, M., Fischer, H., J.M.M.M. 156 23 (1996).Google Scholar
[13] Fischer, H., private communication (1997).Google Scholar
[14] Tsioplakis, K., Goedecke, T., Z. Metallk. 62 681 (1971).Google Scholar
[15] Redfield, A.C. and Zangwill, A.M., Phys. Rev. B, rapid comm. 34, 1378 (1986)Google Scholar