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Standard Characterization of Multi-junction Thin-film Photovoltaic Modules: Spectral Mismatch Correction to Standard Test Conditions and Comparison with Outdoor Measurements

Published online by Cambridge University Press:  01 February 2011

Mauro Pravettoni ,
Georgios Tzamalis ,
Komlan Anika ,
Davide Polverini  and
Harald Müllejans
Mauro Pravettoni
Affiliation:
m.pravettoni06@imperial.ac.ukmauro.pravettoni@fastwebnet.it, European Commission, DG JRC, Institute for Energy, Renewable Energy Unit, Ispra, Varese, Italy
Georgios Tzamalis
Affiliation:
georgios.tzamalis@jrc.ec.europa.eu, European Commission, DG JRC, Institute for Energy, Renewable Energy Unit, Ispra, Italy
Komlan Anika
Affiliation:
Komlan.ANIKA@ec.europa.eu, European Commission, DG JRC, Institute for Energy, Renewable Energy Unit, Ispra, Varese, Italy
Davide Polverini
Affiliation:
davide.polverini@jrc.ec.europa.eu, European Commission, DG JRC, Institute for Energy, Renewable Energy Unit, Ispra, Varese, Italy
Harald Müllejans
Affiliation:
Harald.MUELLEJANS@ec.europa.eu, European Commission, DG JRC, Institute for Energy, Renewable Energy Unit, Ispra, Varese, Italy
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Abstract

Multi-junction thin-film devices have emerged as very promising PV materials due to reduced cost, manufacturing ease, efficiency and long term performance. The consequent growing interest of the PV community has lead to the development of new methods for the correction of indoor measurements to standard test conditions (STC), as presented in this paper. The experimental setup for spectral response measurement of multi-junction large-area thin-film modules is presented. A method for reliable corrections of indoor current-voltage characterization to STC is presented: results are compared with outdoor measurements where irradiance conditions are close to standard ones, highlighting ongoing challenges in standard characterization of such devices.

Keywords

photovoltaicthin filmSi
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1245: Symposium A – Amorphous and Polycrystalline Thin-Film Silicon Science and Technology-2010 , 2010 , 1245-A13-06
Copyright
Copyright © Materials Research Society 2010

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References

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