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Stress-Caused Deflections of Asymmetrical Coated Single-Crystal Silicon Elements

Published online by Cambridge University Press:  10 February 2011

M. Kuechler ,
K. Griesbach ,
A. Bertz ,
T. Gessner ,
W. Faust  and
R. Dudek
M. Kuechler
Affiliation:
Chemnitz University of Technology, Center of Microtechnologies, D-09107 Chemnitz, GERMANY, kuechler @e-technik.tu-chemnitz.de
K. Griesbach
Affiliation:
Chemnitz University of Technology, Center of Microtechnologies, D-09107 Chemnitz, GERMANY, kuechler @e-technik.tu-chemnitz.de
A. Bertz
Affiliation:
Chemnitz University of Technology, Center of Microtechnologies, D-09107 Chemnitz, GERMANY, kuechler @e-technik.tu-chemnitz.de
T. Gessner
Affiliation:
Chemnitz University of Technology, Center of Microtechnologies, D-09107 Chemnitz, GERMANY, kuechler @e-technik.tu-chemnitz.de
W. Faust
Affiliation:
Fraunhofer IZM Berlin/Chemnitz, GERMANY
R. Dudek
Affiliation:
Fraunhofer IZM Berlin/Chemnitz, GERMANY
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Abstract

Long and narrow beams of single crystal silicon were made by surrounding them with trenches of different width followed by dry release etch. The beams were coated nonconformally during fabrication. Depending on the asymmetry of the films coated onto the beam sidewalls they tend to bend laterally. This deflection has been analyzed experimentally and by FEM-Simulations.

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