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Stress—Strain Behaviour of thin films using a Spherical Tipped Indenter

Published online by Cambridge University Press:  22 February 2011

T. J. Bell ,
J. S. Field  and
M. V. Swain
T. J. Bell
Affiliation:
CSIRO Division of Applied Physics, Lindfield, NSW 2070, Australia
J. S. Field
Affiliation:
CSIRO Division of Applied Physics, Lindfield, NSW 2070, Australia
M. V. Swain
Affiliation:
CSIRO Division of Applied Physics, Lindfield, NSW 2070, Australia
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Abstract

The stress—strain behaviour of metallic and polymer thin films are measured using a spherical indenter. A modification of the Hertzian analysis enables the elastic to plastic transition to be analyzed so that the variation of mean pressure versus depth can be calculated. The stress—strain behaviour is then calculated from the mean indentation strain using a relationship proposed by Tabor[l]. Observations of high precision load displacement data generated with a UMIS—2000 instrument are analyzed on the basis of the simple analysis developed. The measured values are compared with simulated data for the same materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 239: Symposium D – Thin Films: Stresses and Mechanical Properties III , 1991 , 331
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

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