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Structural Analyses and Magnetic Properties of Multiple-Structure Multilayered Co/Au Films

Published online by Cambridge University Press:  01 February 2011

Rimika Koiwai ,
Masanobu Kobayashi  and
Yoshinori Maeno
Rimika Koiwai
Affiliation:
Department of Material Science, Chiba Institute of Technology, 2-17-1 Narashino-shi, Tsudanuma, Chiba 275-0016, Japan Advanced Device Laboratory, Oki Electric Industry Co. Ltd., 550-5 Higashiasakawa, Hachioji-shi, Tokyo 193-8550, Japan
Masanobu Kobayashi
Affiliation:
Department of Material Science, Chiba Institute of Technology, 2-17-1 Narashino-shi, Tsudanuma, Chiba 275-0016, Japan Advanced Device Laboratory, Oki Electric Industry Co. Ltd., 550-5 Higashiasakawa, Hachioji-shi, Tokyo 193-8550, Japan
Yoshinori Maeno
Affiliation:
Department of Material Science, Chiba Institute of Technology, 2-17-1 Narashino-shi, Tsudanuma, Chiba 275-0016, Japan Advanced Device Laboratory, Oki Electric Industry Co. Ltd., 550-5 Higashiasakawa, Hachioji-shi, Tokyo 193-8550, Japan
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Abstract

In the interfaces of multilayered Co/Au and Co/Pd films, there were some interesting changes with annealing. For profile fittings, which is a comparison between measured peaks of X-ray diffraction and calculated peaks of the extended 3-step model profile fittings, the mixed layers between Co layers and noble metal layers were decreased in Co/Au films while increased in Co/Pd films. These results are based on the difference that Co-Au is a eutectic system while Co-Pd is an isomorphous system. This time, as new research, we fabricated multiple-structure multilayered Co/Au films (MSM Co/Au films). Magnetic properties and structural analyses were carried out with a vibrating sample magnetometer (VSM), X-ray diffraction (XRD), and extended 3-step model profile fittings. MSM Co/Au films have two periodic thicknesses. MSM Co/Au films showed the same perpendicular magnetization as Co/Au and Co/Pd films, which is dependent on the Co layer thickness. Perpendicular magnetization showed the maximum value after 1 h-annealing at 473 K. It was well confirmed that the mixed layers decreased at this annealing condition with the extended 3-step model profile fittings.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 728: Symposium S – Functional Nanostructured Materials through Multiscale Assembly and Novel Patterning Techniques , 2002 , S8.29
Copyright
Copyright © Materials Research Society 2002

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References

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