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Structural Properties of Single Crystal Rare-Earth Thin Films Y and Gd Grown by Molecular Beam Epitaxy

Published online by Cambridge University Press:  26 February 2011

J. Kwo ,
D. B. McWhan ,
M. Hong ,
E. M. Gyorgy ,
L. C. Feldman  and
J. E. Cunningham
J. Kwo
Affiliation:
AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, New Jersey 07974
D. B. McWhan
Affiliation:
AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, New Jersey 07974
M. Hong
Affiliation:
AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, New Jersey 07974
E. M. Gyorgy
Affiliation:
AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, New Jersey 07974
L. C. Feldman
Affiliation:
AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, New Jersey 07974
J. E. Cunningham
Affiliation:
University of Illinois at Urbana-Champaign, Urbana Illinois 61801
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Abstract

By means of metal MBE technique with in-situ RHEED characterization, high-quality single crystal rare earth metal films of yttrium and gadolinium were grown as a necessary requirement for studying Gd/Y superlattices. The key step of this successful growth is the employment of the single-crystal Nb film as a buffer layer to eliminate the interaction of rare earth metals with most substrates. Structural analyses by X-ray diffraction and ion channeling show that these crystals exhibit not only complete texture of [00.1], but also narrow rocking curves both perpendicular (00.2) and parallel (10.0) to the film.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 37: Symposium D – Layered Structures, Epitaxy, and Interfaces , 1984 , 509
Copyright
Copyright © Materials Research Society 1985

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References

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