Hostname: page-component-78c5997874-s2hrs Total loading time: 0 Render date: 2024-11-10T05:02:45.405Z Has data issue: false hasContentIssue false
  • English
  • Français

Structure and Sensor Properties of a Robust GMR Material System

Published online by Cambridge University Press:  10 February 2011

K.-M. H. Lenssen ,
J. J. T. M. Donkers ,
A. E. T. Kuiper  and
J. VAN Driel
K.-M. H. Lenssen
Affiliation:
Philips Research Laboratories, Prof. Holstlaan 4, NL-5656 AA Eindhoven, The Netherlands
J. J. T. M. Donkers
Affiliation:
Philips Centre for Manufacturing Technology, Prof. Holstlaan 4, NL-5656 AA Eindhoven, The Netherlands
A. E. T. Kuiper
Affiliation:
Philips Research Laboratories, Prof. Holstlaan 4, NL-5656 AA Eindhoven, The Netherlands
J. VAN Driel
Affiliation:
Van der Waals-Zeeman Institute, University of Amsterdam, Valckenierstraat 65, NL-1018 XE Amsterdam, The Netherlands
Get access

Abstract

Recently we have developed a robust GMR material system, based on an artificial antiferromagnet which is exchange-biased with Ir-Mn. By combining magnetoresistance and magnetization measurements with Transmission Electron Microscopy analyses we show that the degree of [111] texture has direct effects on the sensor properties of the GMR multilayer. The degree of texture turns out to depend not only on the buffer layer, but also on the thickness of the Ir-Mn layer. The strongest texture is found for Ir-Mn layer thicknesses of around 4 nm. For this thickness the largest exchange-biasing field and GMR ratio are also obtained (after cooling in a magnetic field), but the blocking temperature is significantly reduced. If attention is paid to the material structure by choosing the right materials, layer thicknesses and stack order, a robust GMR multilayer system can be made that can withstand high temperatures (> 200°C) and strong magnetic fields (> 200 kA/m), as has been demonstrated experimentally.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 562: Symposium L – Polycrystalline Metal & Magnetic Thin Films , 1999 , 33
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Baibich, M. N., Broto, J. M., Fert, A., Nguyen Van Dau, F., Petroff, F., Etienne, P., Creuzet, G., Friederich, A. and Chazelas, J., Phys. Rev. Lett. 61, 2472 (1988); G. Binasch, P. Griinberg, F. Saurenbach and W. Zinn, Phys. Rev. B 39, 4828 (1989).Google Scholar
2. Lenssen, K.-M.H., Kuiper, A. E. T. and Roozeboom, F., J. Appl. Phys. 85, 5531 (1999).Google Scholar
3. van Driel, J., Coehoorn, R., Lenssen, K.-M. H., Kuiper, A. E. T. and de Boer, F. R., J. Appl. Phys. 85, 5522 (1999).Google Scholar
4. A recent review of the exchange-biasing effect is: Nogués, J. and Schuller, I. K., J. Magn. Magn. Mater. 192, 203 (1999).Google Scholar
5. Lenssen, K.-M. H., De Veirman, A. E. M. and Donkers, J. J. T. M., J. Appl. Phys. 81, 4915 (1997).Google Scholar
6. Jacobs, J. W. M. and Verhoeven, J. F. C. M., J. Microscopy 143, 103 (1986).Google Scholar
7. van den Berg, H. A. M., Clemens, W., Gieres, G., Rupp, G., Schelter, W. and Vieth, M., IEEE Trans. Magn. 32, 4624 (1996); Siemens, Magnetic Sensors-Giant Magneto Resistors, Application Notes 10.98 (also at www. siemens. de/semiconductor/products).Google Scholar
8. Lenssen, K.-M. H., Adelerhof, D. J., Gassen, H. J., Kuiper, A. E. T., Somers, G. H. J. and van Zon, J. B. A., Robust giant magnetoresistance sensors, to be published in Proceedings Eurosensors XIII (12–15 September 1999, The Hague, The Netherlands).Google Scholar
9. Nakatani, R., Hoshino, K., Noguchi, S. and Sugita, Y., Jpn. J. Appl. Phys. 33, 133 (1994).Google Scholar
10. Choe, G. and Gupta, S., Appl. Phys. Lett. 70, 1766 (1997).Google Scholar
11. Devasahayam, A. J., Sides, P. J. and Kryder, M. H., J. Appl. Phys. 83, 7216 (1998); A.J. Devasahayam and M.H. Kryder, Abstracts MMM'98, p. 210 (1998).Google Scholar
12. van Driel, J. et al., to be published.Google Scholar
13. Nakatani, R., Hoshiya, H., Hoshino, K. and Sugita, Y., J. Magn. Magn. Mater. 173, 321 (1997).Google Scholar
14. Ambrose, T. and Chien, C.L., J. Appl. Phys. 79, 5920 (1996).Google Scholar