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Structure and Vibrational Properties of Isolated Carbon Nanocrystallites

Published online by Cambridge University Press:  15 February 2011

V. I. Merkulov ,
J. S. Lannin  and
J. M. Cowley
V. I. Merkulov
Affiliation:
Dept. of Physics, Penn State University, University Park, PA 16802
J. S. Lannin
Affiliation:
Dept. of Physics, Penn State University, University Park, PA 16802
J. M. Cowley
Affiliation:
Dept. of Physics and Astronomy, Arizona State University, Tempe, AZ 85287–1504
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Abstract

Small isolated nanocrystallites of carbon have been prepared on amorphous SiO2 and studied by interference enhanced Raman scattering (IERS) and scanning transmission electron microscopy (STEM). A new mode of dark field STEM, using a thin annular detector, has allowed imaging of 1–2 nm graphite-like particles using (002) diffraction. For such small particles, the Raman spectra provide the first evidence for changes in the phonon density of states of a nanocrystalline system.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 452 , 1996 , 225
Copyright
Copyright © Materials Research Society 1997

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References

REFERENCES

1.Steigerwald, M.L. et al. J. Am. Chem. Soc. 110, 3046 (1988)Google Scholar
2.Schlupper, S. et al. Phys. Rev. Lett. 72, 2648 (1994)Google Scholar
3.Alben, R., Weaire, D., Smith, J.E. Jr., and Brodsky, M.H., Phys. Rev. B11, 2271 (1975)Google Scholar
4.Lannin, J.S. in Semiconductors and Semimetals, Vol. 21(B) ed. Pankove, J.I. (Academic Press, 1984), p. 159Google Scholar
5.Fortner, J.A. and Lannin, J.S., Surf. Sci. 254, 251 (1991)Google Scholar
6.Tuinstra, F. and Koenig, J.L., J. Chem. Phys. 53, 1126 (1970)Google Scholar
7.Nemanich, R.J. and Solin, S.A., Phys. Rev. B20, 392 (1979)Google Scholar
8.Li, F. and Lannin, J.S., Appl. Phys. Lett. 61, 2116 (1992)Google Scholar
9.Oberlin, A. in Chemistry and Physics of Carbon, Vol. 22 ed. Thrower, P.A. (M. Dekker, N.Y., 1989), p. 1Google Scholar
10.Mildner, D.F.R. and Carpenter, J.M., Proc. 5th Int. Conf. Amorphous and Liquid Semiconductors, ed. Stuke, J. and Brenig, W. (Taylor and Francis, London, 1974) p. 463Google Scholar
11.Li, F. and Lannin, J.S., Phys. Rev. Lett. 65, 1905 (1990)Google Scholar
12.Connell, G.A.N., Nemanich, R.J. and Tsai, C.C., Appl. Phys. Lett. 36, 31 (1980)Google Scholar
13.Bacsa, W.S. and Lannin, J.S., Appl. Phys. Lett. 61, 19 (1992)Google Scholar
14.Crewe, A.V., Wall, J. and Langmore, J.P., Science 168, 1338 (1970)Google Scholar
15.Cowley, J.M., Ultramicroscopy 49, 4 (1993)Google Scholar
16.Liu, R.-J. and Cowley, J.M., J. Microscopy Soc. Amer. (1996) (in press)Google Scholar
17.Cowley, J.M., Merkulov, V.I. and Lannin, J.S., Ultramicroscopy (in press)Google Scholar
18.Kamitakahara, W.A., Lannin, J.S., Cappelletti, R.L., Copley, J.R.D. and Li, F., Physica B 180, 709 (1992)Google Scholar
19.Wang, C.Z. and Ho, K.M. (private communication)Google Scholar