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A Study of Parameters that Influence Growth and Stability of the (Bi1−xPbx)2Sr2Ca2Cu3Oy Phase

Published online by Cambridge University Press:  26 February 2011

J. S. Luo ,
N. Merchant ,
V. A. Maroni ,
D. M. Gruen ,
B. S. Tani ,
W. L. Carter ,
G. N. Riley  and
K.H. Sandhage
J. S. Luo
Affiliation:
Argonne National Laboratory, Argonne, IL. 60439
N. Merchant
Affiliation:
Argonne National Laboratory, Argonne, IL. 60439
V. A. Maroni
Affiliation:
Argonne National Laboratory, Argonne, IL. 60439
D. M. Gruen
Affiliation:
Argonne National Laboratory, Argonne, IL. 60439
B. S. Tani
Affiliation:
Argonne National Laboratory, Argonne, IL. 60439
W. L. Carter
Affiliation:
American Superconductor Corporation, Watertown, MA 02172
G. N. Riley
Affiliation:
American Superconductor Corporation, Watertown, MA 02172
K.H. Sandhage
Affiliation:
American Superconductor Corporation, Watertown, MA 02172
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Abstract

The growth and stability of the (Bi1-xPbx)2Sr2Ca2Cu3Oy (Bi-2223) phase contained in silver-sheathed wires has been investigated by a combination of x-ray diffraction, scanning electron microscopy, energy dispersive x-ray analysis, and transmission electron microscopy. Silver tubes loaded with Bi-2223 precursor powders were processed into filaments using established metallurgical techniques. The filaments were then heat-treated at selected temperatures (800 to 845°C) for a range of times (10 to 6000 min) in a 7.5% oxygen atmosphere. From these studies it has been possible to investigate the time-temperature-oxygen pressure domains wherein Bi2Sr2CaCu2O8 (Bi-2212) + second phases transform to Bi-2223. Fractional conversion (Bi-2212 --> Bi-2223) versus time data show good conformance to the kinetic model for a diffusion-controlled reaction at the interface between thin sheets and a fine powder or a fluid. Quenching experiments also reveal that the Bi-2223 phase is stable in a limited temperature interval between 810 and 830°C.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 275: Symposium S – Layered Superconductors: Fabrication, Properties and Applications , 1992 , 233
Copyright
Copyright © Materials Research Society 1992

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References

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