Hostname: page-component-78c5997874-8bhkd Total loading time: 0 Render date: 2024-11-10T13:56:53.879Z Has data issue: false hasContentIssue false
  • English
  • Français

Surface Characterization of Clean Gd5Ge4(010)

Published online by Cambridge University Press:  11 December 2012

Chad D. Yuen ,
Gordon J. Miller  and
Patricia A. Thiel
Chad D. Yuen
Affiliation:
Ames Laboratory, Iowa State University, Ames, Iowa, 50011 Department of Chemistry, Iowa State University, Ames, Iowa 50011
Gordon J. Miller
Affiliation:
Ames Laboratory, Iowa State University, Ames, Iowa, 50011 Department of Chemistry, Iowa State University, Ames, Iowa 50011
Patricia A. Thiel
Affiliation:
Ames Laboratory, Iowa State University, Ames, Iowa, 50011 Department of Chemistry, Iowa State University, Ames, Iowa 50011 Department of Material Science and Engineering, Iowa State University, Ames, Iowa 50011
Get access

Abstract

Based on X-ray photoelectron spectroscopy, Gd5Ge4(010) does not show evidence of surface segregation. Scanning tunneling microscopy reveals two types of terraces which alternate laterally on the surface. From the step heights, these two surface terminations are assigned as dense, Gd-pure layers in the bulk structure. There is evidence of reconstruction on one type of terrace.

Keywords

quasicrystalscanning tunneling microscopy (STM)alloy
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1517: Symposium KK – Complex Metallic Alloys , 2013 , mrsf12-1517-kk02-09
Copyright
Copyright © Materials Research Society 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Dubois, J.M., Useful Quasicrystals, World Scientific, Singapore, 2005.10.1142/3585CrossRefGoogle Scholar
Dubois, J.M., Chem. Soc. Rev. 41 (2012) 6760–6777.10.1039/c2cs35110bCrossRefGoogle Scholar
Thiel, P.A., Ünal, B., Jenks, C.J., Goldman, A.I., Canfield, P.C., Lograsso, T.A., Evans, J.W., Quiquandon, M., Gratias, D., Van Hove, M.A., Israel J. Chemistry 51 (2011) 1326–1339.10.1002/ijch.201100148CrossRefGoogle Scholar
Armbrüster, M., et al. ., Nat. Mater. 11 (2012) 690–693.10.1038/nmat3347CrossRefGoogle Scholar
Pecharsky, V.K., Gschneidner, K.A., Physical Review Letters 78 (1997) 4494–4497.10.1103/PhysRevLett.78.4494CrossRefGoogle Scholar
Brück, E., Tegus, O., Thanh, D.T.C., Buschow, K.H.J., J.Magnetism and Magn. Mat. 310 (2007) 2793–2799.10.1016/j.jmmm.2006.10.1146CrossRefGoogle Scholar
Smith, G.S., Tharp, A.G., Johnson, W., Acta Crystallographica 22 (1967) 940–943.10.1107/S0365110X67001902CrossRefGoogle Scholar
Yang, H.F., Rao, G.H., Liu, G.Y., Ouyang, Z.W., Liu, W.F., Feng, X.M., Chu, W.G., Liang, J.K., Journal of Alloys and Compounds 361 (2003) 113–117.10.1016/S0925-8388(03)00384-0CrossRefGoogle Scholar
Pecharsky, V.K., Gschneidner, K.A., J. Alloys and Compounds 260 (1997) 98–106.10.1016/S0925-8388(97)00143-6CrossRefGoogle Scholar
Sharma, H.R., Fournée, V., Shimoda, M., Ross, A.R., Lograsso, T.A., Tsai, A.P., Yamamoto, A., Phys. Rev. Lett. 93 (2004) 165502.10.1103/PhysRevLett.93.165502CrossRefGoogle Scholar
Papadopolos, Z., Pleasants, P., Kasner, G., Fournée, V., Jenks, C.J., Ledieu, J., McGrath, R., Phys. Rev. B 69 (2004) 224201.10.1103/PhysRevB.69.224201CrossRefGoogle Scholar
Yuen, C.D., Ph.D. Thesis, Iowa State University, Ames, 2012.Google Scholar
Samples were synthesized at the Materials Preparation Center, Ames Laboratory USDOE, Ames, IA, USA.Google Scholar
Ünal, B., Evans, J.W., Lograsso, T.A., Ross, A.R., Jenks, C.J., Thiel, P.A., Phil. Mag 87 (2007) 2995–3001.10.1080/14786430701364960CrossRefGoogle Scholar
Ünal, B., Jenks, C., Thiel, P.A., Phys. Rev B 77 (2008) 195419.10.1103/PhysRevB.77.195419CrossRefGoogle Scholar
Ünal, B., Jenks, C.J., Thiel, P.A., J. Phys: Condens. Matter. 21 (2009) 055009.Google Scholar
Addou, R., Gaudry, E., Deniozou, Th., Heggen, M., Feuerbacher, M., Gille, P., Grin, Yu., Widmer, R., Gröning, O., Fournée, V., Dubois, J.-M., Ledieu, J., Phys. Rev B 80 (2009) 014203.10.1103/PhysRevB.80.014203CrossRefGoogle Scholar
Heekeun, S., Pussi, K., Gaudry, E., Ledieu, J., Fournée, V., Alarcon Villaseca, S., Dubois, J.M., Grin, Yu., Gille, P., Moritz, W., Diehl, R.D., Phys. Rev. B 84 (2011) 085411.Google Scholar
Ünal, B., Lograsso, T.A., Ross, A.R., Jenks, C.J., Thiel, P.A., Phys. Rev. B 71 (2005) 165411.10.1103/PhysRevB.71.165411CrossRefGoogle Scholar
Shimoda, M., Sharma, H.R., Tsai, A.P., Surface Science 598 (2005) 88–95.10.1016/j.susc.2005.08.029CrossRefGoogle Scholar
Duguet, T., Ünal, B., de Weerd, M.C., Ledieu, J., Ribeiro, R.A., Canfield, P.C., Deloudi, S., Steurer, W., Jenks, C.J., Dubois, J.-M., Fournée, V., Thiel, P.A., Physical Review B 80 (2009) 024201.10.1103/PhysRevB.80.024201CrossRefGoogle Scholar
Duguet, T., Ünal, B., Ledieu, J., Dubois, J.M., Fournée, V., Thiel, P.A., Phys Rev. Lett. 106 (2011) 076101.10.1103/PhysRevLett.106.076101CrossRefGoogle Scholar