Hostname: page-component-745bb68f8f-5r2nc Total loading time: 0 Render date: 2025-01-15T01:07:19.072Z Has data issue: false hasContentIssue false
  • English
  • Français

Surface Sensitivity Effects With Local Probe Scanning Auger-Scanning Electron Microscopy

Published online by Cambridge University Press:  10 February 2011

D. T. L. Van Agterveld ,
G. Palasantzas  and
J.Th.M. De Hosson
D. T. L. Van Agterveld
Affiliation:
Department of Applied Physics, Materials Science Centre and Netherlands Institute for Metals Research, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands, email: hossonj@phys.rug.nl
G. Palasantzas
Affiliation:
Department of Applied Physics, Materials Science Centre and Netherlands Institute for Metals Research, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands, email: hossonj@phys.rug.nl
J.Th.M. De Hosson
Affiliation:
Department of Applied Physics, Materials Science Centre and Netherlands Institute for Metals Research, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands, email: hossonj@phys.rug.nl
Get access

Abstract

Ultra-high-vacuum segregation studies on in-situ fractured Cu-Sb alloys were performed in terms of nanometer scale scanning Auger/Electron microscopy. S contamination leads to the formation of Cu2S precipitates which, upon removal due to fracture, expose pits with morphology that depends on the precipitate size and shape. Local variations of S and Sb distributions inside the pits were correlated to local surface orientations as Atomic Force Microscopy analysis revealed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 589 , 1999 , 81
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Seah, M.P. in Practical Surface Analysis, Vol. 1 (Ed. Briggs, D., Seah, M.P.), John Wiley & Sons Ltd., Chicester, UK, 1990, Chapter 7Google Scholar
[2] Balluffi, R.W. in Interfacial Segregation (Ed. Johnson, W.C., Blakely, J.M.), American Society for Metals, Metals Park, Ohio, USA, 1979.Google Scholar
[3]Smith, J.R., Hong, T., Srolovitz, D.J., Phys. Rev. Lett. 72, p.4021 (1994).Google Scholar
[4]Shashkov, D.A., Seidman, D.N., Appl. Surf. Sci., 94/95, 416 (1996).Google Scholar
[5]Hosson, J.Th.M. De, Groen, H.B., Kooi, B.J., Vitek, V., Acta Mater., 47, 4077, 1999.Google Scholar
[6] Korzhavyi, P.A., Abrikosov, I.A., Johansson, B., Acta. Mater., 47 (199), 1417.Google Scholar
[7] Schleef, D., Scheafer, D.M., Andres, R.P., Reifenberger, R., Phys. Rev. B 55 (1997) 2532.Google Scholar
[8] Hegeman, J.B.J.W., Kooi, B.J., Groen, H.B., Hosson, J.Th.M. De, J. Appl. Phys. 68 (1999), 3661.Google Scholar