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Surface Sensitivity Effects With Local Probe Scanning Auger-Scanning Electron Microscopy

Published online by Cambridge University Press:  10 February 2011

D. T. L. Van Agterveld ,
G. Palasantzas  and
J.Th.M. De Hosson
D. T. L. Van Agterveld
Affiliation:
Department of Applied Physics, Materials Science Centre and Netherlands Institute for Metals Research, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands, email: hossonj@phys.rug.nl
G. Palasantzas
Affiliation:
Department of Applied Physics, Materials Science Centre and Netherlands Institute for Metals Research, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands, email: hossonj@phys.rug.nl
J.Th.M. De Hosson
Affiliation:
Department of Applied Physics, Materials Science Centre and Netherlands Institute for Metals Research, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands, email: hossonj@phys.rug.nl
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Abstract

Ultra-high-vacuum segregation studies on in-situ fractured Cu-Sb alloys were performed in terms of nanometer scale scanning Auger/Electron microscopy. S contamination leads to the formation of Cu2S precipitates which, upon removal due to fracture, expose pits with morphology that depends on the precipitate size and shape. Local variations of S and Sb distributions inside the pits were correlated to local surface orientations as Atomic Force Microscopy analysis revealed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 589 , 1999 , 81
Copyright
Copyright © Materials Research Society 2001

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References

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