Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-13T02:58:06.912Z Has data issue: false hasContentIssue false

Surface Studies of Laser Annealed Semiconductors

Published online by Cambridge University Press:  15 February 2011

D. M. Zehner
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830
C. W. White
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830
Get access

Abstract

The surface regions of semiconductor single crystals have been examined following laserannealing in an ultrahigh vacuum environment with the output of a pulsed ruby laser. Atomically clean surfaces with impurity levels below 0.1% of a monolayer can be produced by multiple pulse irradiation. Ordered surface structures are produced on low index oriented crystals as well as crystals slightly misoriented. Metastable surface structures exhibiting (l×1) LEED patterns have been produced on (111) orientations and are believed to be a consequence of the rapid cooling rates of 109 degs/sec achieved with the laser irradiation process. The surface and subsurface regions of ion-implanted Si crystals have been examined both before and after laser irradiation and results obtained from Si samples implanted with As are discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1983

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Footnotes

*

Research sponsored by the Division of Materials Sciences, U. S. Department of Energy under contract W-7405-eng-26 with Union Carbide Corporation.

References

REFERENCES

1.Zehner, D. M., White, C. W. and Ownby, G. W., Appl. Phys. Lett. 36, 56 (1980).Google Scholar
2.Westendorp, J. F. M., Wang, Z. L. and Saris, F. W., Laser and Electron Beam Interactions with Solids, Appleton, B. R. and Celler, G. K. eds., (North-Holland, New York), p. 255.Google Scholar
3.Zehner, D. M., White, C. W. and Ownby, G. W., Appl. Phys. Lett. 37, 456 (1980).Google Scholar
4.Zehner, D. M., White, C. W., Appleton, B. R. and Ownby, G. W., Laser and Electron Beam Interactions with Solids, Appleton, B. R. and Celler, G. K. eds., (North Holland, New York) p. 683.Google Scholar
5.Zehner, D. M., White, C. W. and Ownby, G. W., Laser and Electron Beam Processing of Materials, White, C. W. and Peercy, P. S. eds. (Academic Press, New York) p. 201.Google Scholar
6.Zehner, D. M., Noonan, J. R., Davis, H. L. and White, C. W., J. Vac. Sci. Technol. 18, 852 (1981).Google Scholar
7.Bennett, P. A. and Webb, M. B., Surf. Sci. 104, 74 (1981).Google Scholar
8.Eastman, D. E., J. Vac. Sci. Technol. 17, 492 (1980).Google Scholar
9.Zehner, D. M., White, C. W., Heimann, P., Reihl, B., Himpsel, F. J. and Eastman, D. E., Phys. Rev. B 24, 4875 (1981).Google Scholar
10.Duke, C. B. and Ford, W. K., Surf. Sci. 111, L685 (1981)Google Scholar
11.Del Sole, R. and Chadi, D. J., Phys. Rev. B 24, 7431 (1981).Google Scholar
12.Tromp, R. M., van Loenen, E. J., Iwami, M. and Sarris, F. W., Solid State Commun. (in press).Google Scholar
13.Chabal, Y. J., Rowe, J. E. and Christman, S. B., J. Vac. Sci. Technol. 20, 763 (1982).Google Scholar
14.Zehner, D. M., White, C. W. and Ownby, G. W., Surf. Sci. Lett. 92, L67 (1980).Google Scholar
15.Henzler, M., Surf. Sci. 19, 159 (1970);Google Scholar
15a 22, 12 (1970).Google Scholar
16.White, C. W. and Christie, W. H., Solid State Technol. 23, 109 (1980).Google Scholar
17.Eastman, D. E., Heimann, P., Himpsel, F. J., Reihl, B., Zehner, D. M. and White, C. W., Phys. Rev. B 24, 3647 (1981).Google Scholar