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A Synchrotron X-Ray Study of Texture Induced by Application of Magnetic Fields During Phase-Transformations in Shape-Memory Ni-Mn-Ga

Published online by Cambridge University Press:  21 March 2011

R. Vaidyanathan ,
S. Yilmaz ,
R.C. O'Handley  and
D.C. Dunand
R. Vaidyanathan
Affiliation:
Advanced Materials Processing and Analysis Center and Mechanical, Materials and Aerospace Engineering Department, University of Central Florida, Orlando FL 32826, USA
S. Yilmaz
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston IL 60208, USA
R.C. O'Handley
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge MA 02139, USA
D.C. Dunand
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston IL 60208, USA
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Abstract

Ni-Mn-Ga alloys can exhibit a thermoelastic phase transformation near room temperature, which is associated with the shape-memory effect (i.e., temperature-induced strain recovery after twinning) or superelasticity (i.e., strain recovery after a stress-induced phase transformation). This work uses a synchrotron X-ray transmission technique to investigate texture induced by applying magnetic fields during the phase transformation in polycrystalline Ni2MnGa. Synchrotron X-ray radiation is ideally suited for such investigations since the measurements are representative of twinning in the bulk, in contrast with measurements from conventional X-ray sources that represent surface measurements affected by surface relaxation. Magnetic texturing of polycrystalline Ni2MnGa, by cooling through the phase-transformation in the presence of a magnetic field, has potential to lead to polycrystalline materials with more compatible field- induced strains and hence increased twin boundary mobility upon application of a magnetic and/or stress field.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 678: Symposia EE – Applications of Synchrotron Radiation Techniques…IV , 2001 , EE2.7.1
Copyright
Copyright © Materials Research Society 2001

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