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Synchrotron X-Ray Topography of Dislocation Arrays

Published online by Cambridge University Press:  26 February 2011

J. C. Bilello
J. C. Bilello*
Affiliation:
School of Engineering and Computer Science California State University, Fullerton Fullerton, California 92634
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Abstract

The application of relatively low resolution x-ray topography methods, typically ∿ 1 micrometer, is limited in studies which involve large scale dislocation networks. However, the ability to non-destructively image wide areas for “thick” specimens at high intensity with a tunable x-ray source makes the synchrotron an ideal probe for a range of problems previously inaccessible by other methods. Some examples will be discussed such as: (a) crack initiation and propagation in fatigued bicrystals, (b) real-time in situ plastic deformation studies in strain-annealed Mo crystals, and (c) strain distributions in vapor deposited and LPE thin films on Si and GaAs substrates.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 82: Symposium I – Characterization of Defects in Materials , 1986 , 197
Copyright
Copyright © Materials Research Society 1987

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References

REFERENCES

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