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TEM study of InSbTe crystal morphology as a function of crystallization conditions

Published online by Cambridge University Press:  01 February 2011

Marcel A. Verheijen ,
Andrei Mijiritskii  and
Bart J. Kooi
Marcel A. Verheijen
Affiliation:
Philips Centre for Industrial Technology, Eindhoven, the Netherlands
Andrei Mijiritskii
Affiliation:
Philips Centre for Industrial Technology, Eindhoven, the Netherlands
Bart J. Kooi
Affiliation:
University of Groningen, Groningen, the Netherlands
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Abstract

In this work crystallization of an InSbTe alloy in Blu-ray Disc rewritable (BD-RE) media is studied using Transmission Electron Microscopy (TEM). Two different crystalline states can be formed in a thin InSbTe layer depending on crystallization conditions. These two states give rise to different reflectivity levels of the recording stack as well as a different level of normalized media noise. It is shown that the two states correspond to the same phase (R 3 m), but that they show clear differences in morphology as well as in texture.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 803: Symposia GG/HH – Advanced Characterization Techniques for Data Storage Materials – Phase Change and Nonmagnetic Materials for Data Storage , 2003 , HH3.5
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

1. Iwasaki, H., Harigaya, M., Nonoyama, O., Kageyama, Y., Takahashi, M., Yamada, K., Deguchi, H., Ide, Y., Jap. J. Appl. Phys. 32 (1993), 5241.Google Scholar
2. Friedrich, , Weidenhof, V., Njoroge, W., Franz, P., Wuttig, M., J. Appl. Phys. 87 (2000), 4130.Google Scholar
3. Kaiser, M., van Pieterson, L. and Verheijen, M.A.. J. Appl. Phys. (submitted).Google Scholar