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Temperature Dependence of Ag/Ni Multilayer Microstructure Studied by in Situ X-Ray Diffraction

Published online by Cambridge University Press:  10 February 2011

V. Ghetta ,
J. P. Senateur ,
J. La manna ,
G. Delabouglise ,
I. Matko ,
B. Chenevier ,
P. Sandstrom  and
J.-E. Sundgren
V. Ghetta
Affiliation:
Laboratoire de Thermodynamique et de Physico-Chimie Métallurgiques, CNRS UMR 5614, INPG/UJF, Domaine universitaire, BP 75, F-38402 Saint-Martin-d'Hères, France
J. P. Senateur
Affiliation:
Laboratoire des Matériaux et du Génie Physique CNRS UMR 5628, ENSPG, Domaine universitaire, rue de la Houille Blanche, BP 46, F-38402 Saint-Martin-d'Hères, France
J. La manna
Affiliation:
Laboratoire des Matériaux et du Génie Physique CNRS UMR 5628, ENSPG, Domaine universitaire, rue de la Houille Blanche, BP 46, F-38402 Saint-Martin-d'Hères, France
G. Delabouglise
Affiliation:
Laboratoire des Matériaux et du Génie Physique CNRS UMR 5628, ENSPG, Domaine universitaire, rue de la Houille Blanche, BP 46, F-38402 Saint-Martin-d'Hères, France
I. Matko
Affiliation:
Laboratoire des Matériaux et du Génie Physique CNRS UMR 5628, ENSPG, Domaine universitaire, rue de la Houille Blanche, BP 46, F-38402 Saint-Martin-d'Hères, France
B. Chenevier
Affiliation:
Laboratoire des Matériaux et du Génie Physique CNRS UMR 5628, ENSPG, Domaine universitaire, rue de la Houille Blanche, BP 46, F-38402 Saint-Martin-d'Hères, France
P. Sandstrom
Affiliation:
Dept. of Physics, Linköping University, SE-58183 Linköping Sweden
J.-E. Sundgren
Affiliation:
Dept. of Physics, Linköping University, SE-58183 Linköping Sweden
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Abstract

The temperature evolution of the microstructure in a series of [111] fiber textured Ag/Ni multilayer samples has been studied by in situ X-ray diffraction. From the recorded pattern analysis, two regimes can be distinguished. At low temperature (TGB = 120–130°C) where diffusion is likely insignificant, the observed reduction of the width and the increase of the intensity (sharp and quick in some cases) of 111 line-profiles indicate that microstress and defects densities possibly located in column/grain boundaries are considerably lowered. At higher temperatures, diffusion of Ag leads to a transformation of the multilayer stacking essentially characterized by the formation of long Ag coherent domains with (111) planes parallel to the film surface accompanied with a similar but minor effect on Ni. In Ag, some 002 texture component also appears upon annealing. A simple model is proposed to describe the metal recrystallization competing with areas where the multilayer stacking is kept nearly unchanged.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 562: Symposium L – Polycrystalline Metal & Magnetic Thin Films , 1999 , 195
Copyright
Copyright © Materials Research Society 1999

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References

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