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Temperature Dependence of the Mcxd at the GD Lm Edge

Published online by Cambridge University Press:  15 February 2011

K. J. Gofrono ,
C. W. Kimball ,
P. L. Lee ,
G. Jennings  and
P. A. Montano
K. J. Gofrono
Affiliation:
Physics Department, Northern Illinois University, DeKalb, IL 60115 Materials Science Divisiton, Argonne National Laboratory, Argonne, IL 60439
C. W. Kimball
Affiliation:
Physics Department, Northern Illinois University, DeKalb, IL 60115 Materials Science Divisiton, Argonne National Laboratory, Argonne, IL 60439
P. L. Lee
Affiliation:
Materials Science Divisiton, Argonne National Laboratory, Argonne, IL 60439
G. Jennings
Affiliation:
Materials Science Divisiton, Argonne National Laboratory, Argonne, IL 60439
P. A. Montano
Affiliation:
Materials Science Divisiton, Argonne National Laboratory, Argonne, IL 60439 Physics Department, University of Illinois at Chicago, Chicago, IL 60680
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Abstract

An energy dispersive spectrometer is used to measure the temperature dependence of the Magnetic Circular X-ray Dichroism (MCXD) effect at the gadolinium (Gd metal) LIII absorption edge from 94 K to 335 K. In ferromagnetic Gd, the MCXD spectrum consists of the main positive peak with pre- and post-edge features. Only the main positive peak exhibits a temperature dependence similar to that of Gd magnetization. All other features decrease as the temperature increases and vanish slightly above the transition temperature (293 K). Well above the ordering temperature (paramagnetic Gd), the MCXD consists only of the positive peak, with a post-edge background that slowly decays away from it over a range of 90 eV.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 437: Symposium DD – Applications of Synchrotron Radiation to III , 1996 , 91
Copyright
Copyright © Materials Research Society 1996

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