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Testing the Limits of Small Scale Plasticity with Thin Wires in Torsion

Published online by Cambridge University Press:  20 January 2012

Andrew J. Bushby ,
Julien Feuvrier ,
Dong V. Dong  and
David J. Dunstan
Andrew J. Bushby
Affiliation:
School of Engineering and Materials Science, Queen Mary University of London, London E1 4NS, United Kingdom.
Julien Feuvrier
Affiliation:
School of Physics and Astronomy, Queen Mary University of London, London E1 4NS, United Kingdom.
Dong V. Dong
Affiliation:
School of Engineering and Materials Science, Queen Mary University of London, London E1 4NS, United Kingdom.
David J. Dunstan
Affiliation:
School of Physics and Astronomy, Queen Mary University of London, London E1 4NS, United Kingdom.
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Abstract

Torsion experiments on 50μm diameter Cu wires are reported, using the load/unload method and a gauge length of 1m to obtain torsional strain sensitivity better than unity microstrain. The experiments are able to resolve reversible and irreversible deformation at such very low strains. Plastic deformation, dislocation creep and the Bauschinger effect are easily observed at room temperature and at about 300°C, both in the low-strain regime where it is unlikely that dislocation sources are activated, and at higher plastic strain.

Keywords

stress/strain relationshipCudislocations
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1424: Symposium SS – Properties and Processes at the Nanoscale Nanomechanics of Material Behavior , 2012 , mrsf11-1424-ss07-36
Copyright
Copyright © Materials Research Society 2012

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References

REFERENCES

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