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Texture Evolution of Lithium Fluoride Thin Films by Nucleation

Published online by Cambridge University Press:  26 February 2011

Hakkwan Kim  and
Alexander H. King
Hakkwan Kim
Affiliation:
kim87@purdue.edu, Purdue University, Materials Engineering, 501 Northwestern Avenue, West Lafayette, IN, 47907, United States
Alexander H. King
Affiliation:
alexking@ecn.purdue.edu, Purdue University, School of Materials Engineering, 501 Northwestern Avenue, West Lafayette, IN, 47907, United States
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Abstract

We have used a transmission electron microscope (TEM)-based method to extract grain size information for 〈111〉 surface normal grains in lithium fluoride (LiF) thin films, and applied this to analyze textures as a function of substrate temperature and annealing time. The size distributions of grains diffracting into the (111)+(200) and (220) rings were measured separately using dark field (DF) TEM images. From these data, we deduce the distribution of 〈111〉 surface normal grain sizes based on the assumption that only 3 principal textures (100), (110) and (111) exist in films. The (111) texture formation was also observed by x-ray diffraction (XRD). For all deposition and annealing conditions, the grain size data can be matched to lognormal distributions within an acceptable error, but at longer annealing times the distribution becomes bimodal. A novel feature of the LiF films is that the (111) texture component strengthens with annealing and substrate temperature, through the nucleation of new grains rather than the growth of existing ones.

Keywords

texturenucleation & growthtransmission electron microscopy (TEM)
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 979: Symposium HH – Thermodynamics and Kinetics of Phase Transformations in Inorganic Materials , 2006 , 0979-HH11-19
Copyright
Copyright © Materials Research Society 2007

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