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Thermoelectric and Structural Properties of Bi1-xTe1+x Thin Films on CdTe(111)

Published online by Cambridge University Press:  10 February 2011

Yunki Kim ,
Sunglae Cho ,
Antonio DiVenere ,
George K. Wong ,
Jerry R. Meyer  and
John B. Ketterson
Yunki Kim
Affiliation:
Department of Physics and Astronomy, Northwestern University, Evanston, Illinois
Sunglae Cho
Affiliation:
Department of Physics and Astronomy, Northwestern University, Evanston, Illinois
Antonio DiVenere
Affiliation:
Department of Physics and Astronomy, Northwestern University, Evanston, Illinois
George K. Wong
Affiliation:
Department of Physics and Astronomy, Northwestern University, Evanston, Illinois
Jerry R. Meyer
Affiliation:
Code 5613, Naval Research Laboratory, Washington, D.C.
John B. Ketterson
Affiliation:
Department of Physics and Astronomy, Northwestern University, Evanston, Illinois
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Abstract

Thin films of the hexagonal phase of Bi1-xTe1+x have been grown on CdTe(111) substrates using molecular beam epitaxy (MBE). Analysis of X-ray diffraction patterns (θ-2θ scans and rocking curves) of the films shows that their crystallinity depends upon the compositional deviation from stoichiometric BiTe. Measurements of the temperature-dependent thermoelectric power (TEP) of the films reveals that compositional changes cause the TEP to vary from electron dominant (n-type) to hole dominant (p-type), implying their possible application as a thermoelectric cooler or power generator. Measurements of the temperature-dependent resistivity of the films were conducted, and the analysis shows semimetallic behavior. These results demonstrate that Bi1-xTe1+xis an appropriate model system to study the dependencies of thermoelectric and structural properties on binary composition.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 545: Symposium Z – Thermoelectric Materials 1998 - The Next Generation… , 1998 , 177
Copyright
Copyright © Materials Research Society 1999

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