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Thin Film Fabrication of R2Fe14B Compounds

Published online by Cambridge University Press:  25 February 2011

J. F. Zasadzinski ,
C. U. Segre ,
E. D. Rippert ,
J. Chrzas  and
P. Radusewicz
J. F. Zasadzinski
Affiliation:
Department of Physics, Illinois institute of Technology, Chicago, IL 60616
C. U. Segre
Affiliation:
Department of Physics, Illinois institute of Technology, Chicago, IL 60616
E. D. Rippert
Affiliation:
Department of Physics, Illinois institute of Technology, Chicago, IL 60616
J. Chrzas
Affiliation:
Department of Physics, Illinois institute of Technology, Chicago, IL 60616
P. Radusewicz
Affiliation:
Department of Physics, Illinois institute of Technology, Chicago, IL 60616
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Abstract

Thin Films (≃4000 A) of R2Fe14B compounds have been synthesized by d.c. triode sputtering for R=Nd,Sm and Er. Deposition onto single-crystal substrates heated to 600”C and with rates of 1.3 A/s results in nearly epitaxial film growth such that the c-axis of the tetragonal structure is perpendicular to the film plane. As a consequence, intrinsic anisotropy effects are observed in the magnetic properties of the as-made films. Although sapphire and quartz substrates give the best results, similar directed growth is observed on recrystallized Nb foils. Magneto-optical measurements on the Nd-based compounds give a remnant polar Kerr angle θ=0.22° and coercive field Hc=5.5 k0e. The easy axis is in the film plane for R=Sm and Er and a remnant magnetization greater than 80% of saturation is observed for H applied parallel to the film plane. Electrical resistivity measurements on Nd2Fe14B films indicate that spin-disorder scattering from the rare earth site is important and features from both the Curie and spin reorientation temperatures are observed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 96: Symposium F – High Performance Permanent Magnet Materials , 1987 , 55
Copyright
Copyright © Materials Research Society 1987

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References

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