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Transient Creep Behavior of γ-TiAl Polycrystals

Published online by Cambridge University Press:  15 February 2011

B. Viguier
Affiliation:
Ecole Polytechnique Fédérale de Lausanne, Institut de Génie Atomique, Département de Physique, 1015 - Lausanne (Switzerland), viguier@epfl.ch
J. Bonneville
Affiliation:
Ecole Polytechnique Fédérale de Lausanne, Institut de Génie Atomique, Département de Physique, 1015 - Lausanne (Switzerland), viguier@epfl.ch
P. Spätig
Affiliation:
Ecole Polytechnique Fédérale de Lausanne, Institut de Génie Atomique, Département de Physique, 1015 - Lausanne (Switzerland), viguier@epfl.ch
J. L. Martin
Affiliation:
Ecole Polytechnique Fédérale de Lausanne, Institut de Génie Atomique, Département de Physique, 1015 - Lausanne (Switzerland), viguier@epfl.ch
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Abstract

Two types of transient creep experiments performed along stress-strain curves are described and successfully applied to γ TiAl polycrystals at room temperature. They allow to determine activation volumes in good agreement with those measured through successive load relaxation tests. In addition, the combination of the latter method and the present ones provides relevant values of the plastic strain hardening coefficient. This latter parameter is found to exhibit similar values in transient as well as during constant strain rate tests.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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References

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