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A Transmission Electron Microscopy Study of Dislocation Substructures in PLD-grown Epitaxial Films of (Ba,Sr)TiO3 on (001) LaAlO3

Published online by Cambridge University Press:  01 February 2011

I. B. Misirlioglu ,
A. L. Vasiliev ,
M. Aindow ,
R. Ramesh  and
S. P. Alpay
I. B. Misirlioglu
Affiliation:
Department of Metallurgy and Materials Engineering and Institute of Materials Science, University of Connecticut, Storrs, CT 06269
A. L. Vasiliev
Affiliation:
Department of Metallurgy and Materials Engineering and Institute of Materials Science, University of Connecticut, Storrs, CT 06269
M. Aindow
Affiliation:
Department of Metallurgy and Materials Engineering and Institute of Materials Science, University of Connecticut, Storrs, CT 06269
R. Ramesh
Affiliation:
Department of Materials and Nuclear Engineering, University of Maryland, College Park MD 20742
S. P. Alpay
Affiliation:
Department of Metallurgy and Materials Engineering and Institute of Materials Science, University of Connecticut, Storrs, CT 06269
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Abstract

Epitaxial Ba0.6Sr0.4TiO3 films were grown onto (001) LaAlO3 by pulsed-laser deposition, and the dislocation structures of the films were investigated using transmission electron microscopy. Misfit dislocations with a periodicity of about 7 nm and Burgers vectors b = a<100> were observed at the interface. High densities of threading dislocations was present in the films with Burgers vector b = a<100>. The observations reveal that threading dislocations are not generated as the result of half-loop climb from the deposit surface as proposed previously, but are instead formed when misfit dislocations are forced away from the interface during island coalescence.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 784: Symposium C – Ferroelectric Thin Films XII , 2003 , C2.7
Copyright
Copyright © Materials Research Society 2004

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References

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