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Twinning in epilayers of CdTe on <211> Si: Influence of ZnTe buffer layer and substrate misorientation

Published online by Cambridge University Press:  21 February 2011

A. Gray ,
N.K. Dhar ,
W. Clark ,
P. Charlton ,
J.H. Dinan ,
R. Segnan  and
W.E. Mayo
A. Gray
Affiliation:
Army Research Laboratory, Ft. Belvoir, VA;
N.K. Dhar
Affiliation:
Army Research Laboratory, Ft. Belvoir, VA;
W. Clark
Affiliation:
Army Research Laboratory, Ft. Belvoir, VA;
P. Charlton
Affiliation:
Army Research Laboratory, Ft. Belvoir, VA;
J.H. Dinan
Affiliation:
US Army NVESD, Ft. Belvoir, VA;
R. Segnan
Affiliation:
American University, Washington, DC;
W.E. Mayo
Affiliation:
Rutgers University, Piscataway, NJ.
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Abstract

X-ray diffraction spectra of CdTe epilayers grown with and without ZnTe buffer layers on <211> Si substrates by molecular beam epitaxy consist of 422 and 331 reflections. We interpret these as evidence for the existence of twins within the volume of a <211> oriented epilayer and show that twin volume is dependent on the ZnTe buffer layer and substrate misorientation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 399: Symposium D – Evolution of Epitaxial Structure and Morphology , 1995 , 479
Copyright
Copyright © Materials Research Society 1996

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References

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