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X-Ray Reflectivity Study of Single- and Bicrystals of Gold

Published online by Cambridge University Press:  21 February 2011

M. R. Fitzsimmons ,
E. Burkel  and
J. Peisl
M. R. Fitzsimmons
Affiliation:
Sektion Physik der Universitit Mfinchen, Mfinchen, FRG
E. Burkel
Affiliation:
Sektion Physik der Universitit Mfinchen, Mfinchen, FRG
J. Peisl
Affiliation:
Sektion Physik der Universitit Mfinchen, Mfinchen, FRG
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Abstract

X-ray reflectivity techniques have been used to characterize the surfaces of 0.4µm thick Au films epitaxially grown on single-crystals of NaCl. Measurements of both the specular and non-specular reflectivity suggest that the Au surface is very rough. The nonspecular reflectivity provides valuable information about the correlation of the heights at different points on the surface. The first in situ reflectivity study of the formation and destruction of a grain boundary shows direct evidence for the existence of diffuse scattering from the grain boundary. Measurements of several [0011 twist grain boundaries suggest that the roughness and texture of an interface depends upon the geometrical orientation of the surrounding substrates.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 208: Symposium J – Advances in Surface and Thin Film Diffraction , 1990 , 339
Copyright
Copyright © Materials Research Society 1991

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References

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