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A test of the leaf-ancestor metric for parse accuracy

Published online by Cambridge University Press:  25 November 2003

GEOFFREY SAMPSON  and
ANNA BABARCZY
GEOFFREY SAMPSON
Affiliation:
School of Cognitive and Computing Sciences, University of Sussex, Falmer, Brighton BN1 9QH, UK e-mail: geoffs@cogs.susx.ac.uk
ANNA BABARCZY
Affiliation:
School of Cognitive and Computing Sciences, University of Sussex, Falmer, Brighton BN1 9QH, UK e-mail: annab@cogs.susx.ac.uk
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Abstract

The GEIG metric for quantifying the accuracy of parsing became influential through the Parseval programme, but many researchers have seen it as unsatisfactory. The Leaf-Ancestor (LA) metric, first developed in the 1980s, arguably comes closer to formalizing our intuitive concept of relative parse accuracy. We support this claim via an experiment that contrasts the performance of alternative metrics on the same body of automatically-parsed examples. The LA metric has the further virtue of providing straightforward indications of the location of parsing errors.

Type
Papers
Information
Natural Language Engineering , Volume 9 , Issue 4 , December 2003 , pp. 365 - 380
Copyright
© 2003 Cambridge University Press

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