This special June issue of Powder Diffraction is comprised of selected papers presented at the 2010 59th annual Denver X-ray Conference (DXC). At DXC, 16 workshops, 2 poster sessions, and 16 special sessions were held, covering the following topics: Basic XRD, Basic XRF, XRF Sample Prep, Trace Phase Identification, Texture Analysis, 2D Detectors, Cultural Heritage, Quantitative Analysis XRF, Polymers, Pair Distribution Function, Renewable Energy, Polymers-SAXS, Instrumentation, Nanomaterials, Fusion and Industrial Applications XRF, Rietveld Analysis, Handheld XRF, X-ray Imaging, Micro Diffraction, High Resolution XRD, Stress Analysis, and Trace Analysis XRF.
As part of the Denver Conference, proceedings are published and from these proceedings, selected papers covering XRD, XRF, and other high energy scattering methods were chosen for publication in Powder Diffraction. This issue of Powder Diffraction will provide readers with the opportunity to learn about current topics in a variety of materials characterization applications.
The talents of many people are required to make this special issue possible. Besides the authors themselves, we thank the DXC Organizing Committee for their reviews of these articles. We would also like to thank the DXC Conference Coordinator Denise Flaherty, Powder Diffraction Managing Editor Nicole Ernst Boris, and Powder Diffraction Editor-in-Chief Ting Huang for all of their hard work in making this publication a reality. We hope you enjoy this publication and we look forward to seeing you at the 2011 Denver X-ray Conference in Colorado Springs, Colorado 1–5 August 2011 (www.dxcicdd.com).
