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A 2D pixel detector for very high-rate X- and gamma-ray spectroscopy and imaging

Published online by Cambridge University Press:  03 May 2017

Einar Nygård ,
Nail Malakhov ,
Peter Weilhammer ,
Ole Dorholt ,
Ole M. Røhne ,
Terumasa Nagano  and
Koei Yamamoto
Einar Nygård*
Affiliation:
Enxense AS, Asker, Norway
Nail Malakhov
Affiliation:
Enxense AS, Asker, Norway
Peter Weilhammer
Affiliation:
Enxense AS, Asker, Norway CERN, Geneva, Switzerland
Ole Dorholt
Affiliation:
University of Oslo, Norway
Ole M. Røhne
Affiliation:
University of Oslo, Norway
Terumasa Nagano
Affiliation:
Hamamatsu Photonics, Hamamatsu City, Japan
Koei Yamamoto
Affiliation:
Hamamatsu Photonics, Hamamatsu City, Japan
*
a)Author to whom correspondence should be addressed. Electronic mail: einar@enxense.com
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Abstract

A new methodology for very high-speed, energy-dispersive detection of X-ray fluorescence is being developed. The underlying reasoning behind it, as well as early results from the evaluation of the first prototype, is presented.

Keywords

detectorXRFED-XRFmicro-XRFXRDhybrid-pixelhigh-ratehigh-spectral-resolution
Type
Technical Articles
Information
Powder Diffraction , Volume 32 , Issue 2 , June 2017 , pp. 133 - 139
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Copyright
Copyright © International Centre for Diffraction Data 2017 

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Footnotes

†

In memory of the great Peter Weilhammer (1938–2016), friend, mentor and contributor to this project.

References

Beckhoff, B., Kanngießer, B., Langhoff, N., Wedell, R., and Wolff, H. (2007). Handbook of Practical X-Ray Fluorescence Analysis (Springer Science & Business Media, Berlin).Google Scholar
Lechner, P., Fiorini, C., Longoni, A., Lutz, G., Pahlke, A., Soltau, H., and Strüder, L. (2004). “Silicon drift detectors for high resolution, high count rate x-ray spectroscopy at room temperature,” International Centre for Diffraction Data 2004, Advances in X-Ray Analysis 47, 53–58.Google Scholar
Rossi, L., Fischer, P., Rohe, T., and Wermes, N. (2006). Pixel Detectors: from Fundamentals to Applications (Springer Science & Business Media, Berlin).CrossRefGoogle Scholar
Schlosser, D. M., Lechner, P., Lutz, G., Niculae, A., Soltau, H., Strüder, L., Eckhardt, R., Hermenau, K., Schaller, G., Schopper, F., Jaritschin, O., Liebel, A., Simsek, A., Fiorini, C., and Longoni, A. (2010). “Expanding the detection efficiency of silicon drift detectors,” Nucl. Instrum. Methods Phys. Res. A 624, 270–276.CrossRefGoogle Scholar
Wermes, N. (2004). “Trends in pixel detectors: tracking and imaging,” IEEE Trans. Nucl. Sci. 51, 1006–1015.Google Scholar