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D-44 Towards Sub-100 nm X-ray Microscopy for Tomographic Applications

Published online by Cambridge University Press:  20 May 2016

P. Bruyndonckx
Affiliation:
SkyScan, Kontich, Belgium
A. Sasov
Affiliation:
SkyScan, Kontich, Belgium
B. Pauwels
Affiliation:
SkyScan, Kontich, Belgium

Abstract

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Type
Denver X-Ray Conference
Copyright
Copyright © Cambridge University Press 2009

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