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Grain size distribution of nanocrystalline systems

Published online by Cambridge University Press:  01 March 2012

Paolo Scardi ,
Matteo Leoni ,
Diego G. Lamas  and
Edgardo D. Cabanillas
Paolo Scardi
Affiliation:
Department of Materials Engineering and Industrial Technologies, University of Trento, via Mesiano 77, 38050 Trento, Italy
Matteo Leoni
Affiliation:
Department of Materials Engineering and Industrial Technologies, University of Trento, via Mesiano 77, 38050 Trento, Italy
Diego G. Lamas
Affiliation:
CINSO (Centro de Investigaciones en Solidos), CITEFA-CONICET, J. B. de La Salle 4397, (1603) Villa Martelli, Pcia. de Buenos Aires, Argentina
Edgardo D. Cabanillas
Affiliation:
CONICET-Centro Atómico Constituyentes, Comisión Nacional de Energía Atómica, Gral. Paz 1499 (1650) San Martín, Pcia. de Buenos Aires, Argentina
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Abstract

The diffraction pattern of nanocrystalline Ce0.9Zr0.1O2 was analyzed by whole powder pattern modeling, a recently proposed method for the study of line broadening. The main result in this typical case of study—the crystalline domain size distribution—matches closely the corresponding information obtained by transmission electron microscopy. Further information on nature and content of lattice defects is also discussed.

Keywords

line profile analysisdomain size distributionnanocrystalline materialsceria-zirconiapowder diffraction
Type
Invited Articles
Information
Powder Diffraction , Volume 20 , Issue 4 , December 2005 , pp. 353 - 358
Copyright
Copyright © Cambridge University Press 2005

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