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Grazing incidence in-plane X-ray diffraction in the laboratory

Published online by Cambridge University Press:  06 March 2012

B. K. Tanner ,
T. P. A. Hase ,
T. A. Lafford  and
M. S. Goorsky
B. K. Tanner*
Affiliation:
Department of Physics, University of Durham, Durham, DH1 3LE, United Kingdom
T. P. A. Hase
Affiliation:
Department of Physics, University of Durham, Durham, DH1 3LE, United Kingdom
T. A. Lafford
Affiliation:
Department of Physics, University of Durham, Durham, DH1 3LE, United Kingdom
M. S. Goorsky
Affiliation:
Department of Physics, University of Durham, Durham, DH1 3LE, United Kingdom
*
a)Electronic mail: b.k.tanner@dur.ac.uk
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Abstract

The laboratory implementation of grazing incidence in-plane X-ray diffraction, using an unmodified commercial diffractometer, is described. Low resolution, high intensity measurements are illustrated in the study of the in-plane lattice parameters and texture of a thin polycrystalline ZnO film on glass, the in-plane order in Cd arachidate Langmuir–Blodgett films, and the depth dependence of the lattice parameter in graded Si–Ge epilayers. Use of an asymmetrically cut Ge crystal to compress and monochromate the beam provides a high resolution setting, appropriate to measurement of the in-plane mosaic of mismatched epilayers such as GaN on sapphire.

Type
Technical Articles
Information
Powder Diffraction , Volume 19 , Issue 1 , March 2004 , pp. 45 - 48
Copyright
Copyright © Cambridge University Press 2004

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