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Qualitative phase analysis system for crystalline mixtures based on X-ray powder diffraction file

Published online by Cambridge University Press:  05 March 2012

YuanYuan Qiao ,
YunFei Xi ,
DongTao Zhuo ,
Ji Jun Wang  and
ShaoFan Lin
YuanYuan Qiao*
Affiliation:
Central Laboratory, College of Chemistry, Nankai University, Tianjin, 300071People’s Republic of China
YunFei Xi
Affiliation:
Central Laboratory, College of Chemistry, Nankai University, Tianjin, 300071People’s Republic of China
DongTao Zhuo
Affiliation:
Central Laboratory, College of Chemistry, Nankai University, Tianjin, 300071People’s Republic of China
Ji Jun Wang
Affiliation:
Central Laboratory, College of Chemistry, Nankai University, Tianjin, 300071People’s Republic of China
ShaoFan Lin
Affiliation:
Central Laboratory, College of Chemistry, Nankai University, Tianjin, 300071People’s Republic of China
*
a)Electronic mail: yuanyuanqiao@nankai.edu.cn
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Abstract

A qualitative phase identification system for crystalline mixtures is presented. The system provides up to five-phase qualitative identification using up to nine-peak filtration, and additive full peak matching based on the powder diffraction file of ICDD. It was implemented using Microsoft Visual C++, and runs under most common Windows systems. Screenshots and examples are included.

Keywords

x-ray powder diffraction filephase identificationcrystalline mixture
Type
Selected Papers from 2003 Chinese National Symposium on XRD
Information
Powder Diffraction , Volume 19 , Issue 4 , December 2004 , pp. 340 - 346
Copyright
Copyright © Cambridge University Press 2004

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References

Hanawalt, J. D. (1986). “Manual search/match methods for powder diffraction,” Powder Diffr. PODIE2 1, 7–13. pdj PODIE2 CrossRefGoogle Scholar
Hanawalt, J. D., Rinn, H. W., and Frevel, L. K. (1986). “Chemical analysis by X-ray diffraction. Classification and use of X-ray diffraction pattern,” Powder Diffr. PODIE2 2, 2–14. pdj PODIE2 Google Scholar
Hubbard, C. R., Evans, E. H., and Smith, D. K. (1976). “The Reference Intensity Ratio, I/Ic, for Computer Simulated Powder Patterns,” J. Appl. Crystallogr. JACGAR 9, 164–174. acr JACGAR CrossRefGoogle Scholar
Jerkins, R. and Snyder, R. L. (1996). Introduction to X-Ray Powder Diffractometry (Wiley, New York), Chap. 6, pp. 151–172.CrossRefGoogle Scholar
Lin, S. F., Lu, X. J., and Zheng, W. F. (1991). “Identification and simulation of X-ray powder diffraction pattern,” Chin. Chem. Lett. ZZZZZZ 11, 873–876.Google Scholar
Lin, S. F., Lu, X. J., Zheng, W. F., and Zhang, J. B. (1993). “A novel search/match system for X-ray powder diffraction data,” Chemom. Intell. Lab. Syst. CILSEN 20, 85–91. cil CILSEN CrossRefGoogle Scholar
Mighell, A. D. and Holomany, M. A. (1983). NBS*AIDS83: A Manual Describing the Data Format Used in NBS*AIDS83 (JCPDS-International Centre for Diffraction Data, Swarthmore, PA).Google Scholar
Smith, D. K. and Jenkins, R. (1996). “The powder diffraction file: past, present, and future,” J. Res. Natl. Inst. Stand. Technol. JRITEF 101, 259. jri JRITEF CrossRefGoogle ScholarPubMed
Wims, A. M. and Johnson, G. G. (1986). “Interactive dialog for phase identification by the Johnson/V and program for X-ray diffraction data,” Powder Diffr. PODIE2 1, 16–19. pdj PODIE2 CrossRefGoogle Scholar