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Synchrotron X-ray diffraction study of double perovskites Sr2RNbO6 (R = Sm, Gd, Dy, Ho, Y, Tm, and Lu)

Published online by Cambridge University Press:  18 October 2018

W. Wong-Ng*
Affiliation:
Materials Measurement Science Division, National Institute of Standards AND Technology, Gaithersburg, Maryland 20899
J. A. Kaduk
Affiliation:
Department of Chemical Science, Illinois Institute of Technology, Chicago, Illinois 60616
S. H. Lapidus
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439
L. Ribaud
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439
S. P. Diwanji
Affiliation:
Materials Measurement Science Division, National Institute of Standards AND Technology, Gaithersburg, Maryland 20899
*
a)Author to whom correspondence should be addressed. Electronic mail: winnie.wong-ng@nist.gov

Abstract

A series of double-perovskite oxides, Sr2RNbO6 (R = Sm, Gd, Dy, Ho, Y, Tm, and Lu) were prepared and their crystal structure and powder diffraction reference patterns were determined using the Rietveld analysis technique. The crystal structure of each of the Sr2RNbO6 phase is reported in this paper. The R = Gd, Ho, and Lu samples were studied using synchrotron radiation, while R = Sm, Dy, Y, and Tm samples were studied using laboratory X-ray diffraction. Members of Sr2RNbO6 are monoclinic with a space group of P21/n and are isostructural with each other. Following the trend of “lanthanide contraction”, from R = Sm to Lu, the lattice parameters “a” of these compounds decreases from 5.84672(10) to 5.78100(3) Å, b from 5.93192(13) to 5.80977(3) Å, c from 8.3142(2) to 8.18957(5) Å, and V decreases from 288.355(11) to 275.057(2) Å3. In this double-perovskite series, the R3+ and Nb5+ ions are structurally ordered. The average Nb–O bond length is nearly constant, while the average R–O bond length decreases with the decreasing ionic radius of R3+. Powder diffraction patterns for these compounds have been submitted to the Powder Diffraction File (PDF).

Type
Technical Article
Copyright
Copyright © International Centre for Diffraction Data 2018 

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